The invention discloses a method and a system for testing a glass IC. The method comprises the steps of A, irradiating an IC body by means of a light source, then acquiring an image of an irradiating area by means of a CCD, processing the image for distinguishing the IC body from a background in a black-and-white manner; B, searching for crossing parts between black parts and white parts in the image, and obtaining a product area which is surrounded by the IC body in the image through calculation; C, performing zooming processing on a square frame in which the calculated product area exists, and detecting an abnormal area in the image; and D, determining whether the abnormal area exists in the square frame in which the product area exists, and if yes, determining a fact that the abnormity of the IC body occurs. According to the method and the system, through adjusting the light source and processing through a corresponding software algorithm, a problem of light reflection on glass is settled. Image identification technology is used for detecting abnormal products, and a product yield rate is improved. The method for testing according to the invention has functions of reducing number-of-times of inferior mounting on a template, reducing abnormal cost for an enterprise, and improving output amount and quality of products.