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A kind of glass IC detection method and system

A detection method and detection system technology, which is applied in image data processing, instruments, calculations, etc., can solve the problem that glass IC damage cannot be detected in time, and achieve the effects of reducing bad boards, improving product yield, and reducing abnormal costs

Active Publication Date: 2018-07-17
PROSYST ELECTRONICS TECH
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  • Description
  • Claims
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Problems solved by technology

[0004] In view of the above deficiencies in the prior art, the object of the present invention is to provide a glass IC detection method and system, aiming to solve the problem that glass IC damage cannot be detected in time in the prior art

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  • A kind of glass IC detection method and system
  • A kind of glass IC detection method and system
  • A kind of glass IC detection method and system

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Embodiment Construction

[0046] The present invention provides a glass IC detection method and system. In order to make the purpose, technical solution and effect of the present invention clearer and clearer, the present invention will be further described in detail below. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0047] see figure 1 , figure 1 It is a flow chart of a preferred embodiment of a glass IC detection method of the present invention, as shown in the figure, which includes steps:

[0048] S1. Use the light source to irradiate the IC body, then use the CCD to collect the image of the irradiated area, and process the image to make the IC body and the background black and white;

[0049] S2. Search for the intersection of black and white in the image, and calculate the product area enclosed by the IC body in the image;

[0050] S3. Scale the calculated box of the product area, and...

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Abstract

The invention discloses a method and a system for testing a glass IC. The method comprises the steps of A, irradiating an IC body by means of a light source, then acquiring an image of an irradiating area by means of a CCD, processing the image for distinguishing the IC body from a background in a black-and-white manner; B, searching for crossing parts between black parts and white parts in the image, and obtaining a product area which is surrounded by the IC body in the image through calculation; C, performing zooming processing on a square frame in which the calculated product area exists, and detecting an abnormal area in the image; and D, determining whether the abnormal area exists in the square frame in which the product area exists, and if yes, determining a fact that the abnormity of the IC body occurs. According to the method and the system, through adjusting the light source and processing through a corresponding software algorithm, a problem of light reflection on glass is settled. Image identification technology is used for detecting abnormal products, and a product yield rate is improved. The method for testing according to the invention has functions of reducing number-of-times of inferior mounting on a template, reducing abnormal cost for an enterprise, and improving output amount and quality of products.

Description

technical field [0001] The invention relates to the field of IC detection, in particular to a glass IC detection method and system. Background technique [0002] In the prior art, the glass IC is easy to cause glass damage during the processing process, resulting in abnormal products, but this kind of situation occurs more often after the IC is damaged, so the above problems have caused a lot of repeated man-hours, and at the same time Resulting in extremely high anomalous costs. [0003] Therefore, the prior art still needs to be improved and developed. Contents of the invention [0004] In view of the above-mentioned deficiencies in the prior art, the object of the present invention is to provide a glass IC detection method and system, aiming at solving the problem that glass IC damage cannot be detected in time in the prior art. [0005] Technical scheme of the present invention is as follows: [0006] A detection method for a glass IC, wherein, comprising steps: ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/00
CPCG06T7/0004G06T2207/30108
Inventor 周秋香
Owner PROSYST ELECTRONICS TECH
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