115results about How to "Improve conversion speed" patented technology

An analog-to-digital converter (ADC) generates an output digital value equivalent to the difference between two analog signal values. The ADC 30 receives a first analog signal level, a second analog signal level and a ramp signal. A counter 32 is operable to count in a single direction. A control stage is arranged to enable the counter 32 based on a comparison 19 of the ramp signal with the first analog signal and the second analog signal. A digital value accumulated by the counter during a period when it is enabled forms the output. The ADC can perform the conversion during a single cycle of the ramp signal. The counter 32 can be loaded with a starting digital value representing an exposure level accumulated during a previous exposure period. Techniques are described for reducing the conversion time.

Pipelined analog to digital conversion systems are provided having cascaded multi-bit successive approximation register subconverter stages using thermometer coding. Capacitor arrays are provided in the subconverter stages, where switching logic selectively couples the capacitors to operate in sample, conversion, and residue amplification modes for generating multi-bit subconverter digital outputs and analog subconverter residue outputs, wherein the capacitors are switched according to a thermometer code to reduce differential converter non-linearity.

Pipelined analog to digital conversion systems are provided having cascaded multi-bit successive approximation register subconverter stages. Capacitor arrays are provided in the subconverter stages, where switching logic selectively couples the capacitors to operate in sample, conversion, and residue amplification modes for generating multi-bit subconverter digital outputs and analog subconverter residue outputs. In one implementation, the capacitors are switched according to a thermometer code to reduce differential converter non-linearity, and the first subconverter stage gain is reduced to improve the conversion system bandwidth.

The invention discloses a silicon-based display adopting digital-analog hybrid drive. Pixels are driven to emit light through the method of combining the simulation amplitude modulation drive strategy and a digital pulse width modulation drive strategy, wherein the luminance of the pixels is determined by output current or voltage amplitude of the pixels in the subframe and the duty ratio of time of the output current or voltage of the pixels in the subframe, the frame of image is divided into a plurality of different digital subframes and simulation subframes, the digital drive strategy is adopted for the digital subframes, the time proportionable drive mode or luminance proportionable drive mode is adopted, the simulation drive strategy is adopted for the simulation subframes, many digital-analog converters with few digits are adopted, input data is converted into amplitude quantity of voltage or current, so that the pixels emit light, and the simulation subframes and the digital subframes are combined to generate the final display frame. The requirements of the simulation amplitude modulation drive strategy for the digital-analog converter and the requirements of the pixel circuit for the precision of analog quantity are reduced, and the conversion speed of the digital-analog converter and the contrast of the pixel luminance are improved.

A production method of an indentation curve is given, in which when an indentation curve showing a relationship between indentation force and indentation depth in a process of indenting an indenter into a surface of a sample is produced, a measurement range using an (i−n)th (here, i and n are natural numbers) measurement value as a reference is provided, and the indentation depth or indentation force is temporarily measured when the indentation force or indentation depth is gradually changed, respectively, and when a temporarily measurement value obtained by the temporarily measurement is out of the determination range, indentation depth at the relevant indentation force or indentation force at the relevant indentation depth is measured and set as an ith measurement value, or the temporarily measurement value is used as the ith measurement value.

In a solid-state image sensing element which includes a pixel array portion in which a plurality of pixels each including a photoelectric converter are arranged two-dimensionally, and readout circuits which read out analog pixel signals from the pixel array portion by column, and in which each of the readout circuits includes an A / D conversion circuit which converts the analog pixel signal from the pixel array portion into a digital pixel signal, and the A / D conversion circuit performs A / D conversion by comparing, by a comparison unit, a signal level of the analog pixel signal from the pixel array portion with a temporally changing reference level, a frequency band characteristic of the comparison unit is switched in accordance with the signal level of the analog pixel signal from the pixel array portion.

An analog-to-digital converter that converts an analog input signal into a digital signal includes a comparator configured to compare a reference signal with an input signal and, if the input signal matches the reference signal, inverts an output; a counter configured to count a comparison time of the comparator; a control circuit configured to monitor the output of the comparator; a voltage generating circuit configured to generate, if a monitoring result obtained by the control circuit indicates that the output of the comparator is at a predetermined level, a direct current voltage in accordance with the monitoring result; and an analog adder configured to add the voltage generated by the voltage generating circuit to the input signal and supply a sum signal to an input terminal of the comparator.

In a voltage-level shifter, an input line is configured to convey an input voltage to be shifted. A pair of transistors is coupled to and is configured to receive the input voltage from the input line. There is a first side and a second side, with each side comprising the following: a low-voltage transistor that is coupled to the pair of transistors, a medium-voltage transistor that is coupled to the low-voltage transistor, a high-voltage transistor that is coupled to the medium-voltage transistor, and an output line, which is coupled to the first and second sides, for providing an output voltage that is higher than the input voltage.

A successive approximation analog / digital converter is provided, which includes a successive approximation register supplying a digital / analog converter, first means of comparing an input signal of the analog / digital converter to an output signal of the digital / analog converter delivering a first comparison signal, said successive approximation analog / digital converter being synchronised by a clock signal coming from a conversion clock. A method such as this includes dynamic adaptation of the conversion clock period based on at least one parameter.

A hybrid analog-to-digital converter includes a plurality of converting circuits. Each converting circuit is configured to provide a digital signal based on an analog input signal by performing a successive approximation conversion to obtain, as a result of the successive approximation conversion, a first number of bits of the digital signal, and by subsequently performing a slope conversion based on a common variable reference voltage to obtain a second number of bits of the digital signal, the second number of bits corresponding to a residual between the analog input signal and the result of the successive approximation conversion. The hybrid analog-to-digital converter further includes a common variable reference voltage provider configured to provide to each converting circuit of the plurality of converting circuits the common variable reference voltage.

The invention discloses a quick high-precision method for sampling the analog quantity in an alternating current speed regulating system of a mine hoist, belonging to a quick high-precision sampling method for a motor. The sampling method comprises a quick high-precision sampling circuit, wherein the circuit is provided with a module with a sigma-delta modulating function, an FPGA (Field Programmable Gate Array) for filtering and a DSP (Digital Signal Processor) for controlling, wherein the output of the module with the sigma-delta modulating function is a pulse stream Mdate and a high-frequency sampling clock input signal Mclk; the pulse stream Mdate and the high-frequency sampling clock input signal Mclk are used as inputs of a filter in the FPGA; and the FPGA communicates with the DSP through an external interface XINTF (eXternal INTerFace). The invention has the advantages that the quick high-precision method is simple, reliable and easy to realize; and high analog-to-digital conversion precision and conversion speed can be obtained by using a proper module with the sigma-delta modulating function. The quick high-precision method is applied to a motor for controlling the extraction of a voltage fundamental wave so as to quickly and accurately extract the fundamental wave of the voltage; and the extracted fundamental wave of the voltage can be directly applied to control or protection of the motor.

A solid-state imaging device includes a reference-signal generating unit that generates plural kinds of reference signals for converting an analog pixel signal into digital data, a reference-signal selecting unit that selects any one of the plural kinds of reference signals, a comparing unit that compares the pixel signal and the selected reference signal, and a count unit that performs count processing in parallel with comparison processing in the comparing unit and stores a count value at a point when the comparison processing is completed. The count unit decides digital data of the pixel signal in a 1 LSB step by storing a count value at a point when the comparison processing is completed for any one of the plural kinds of reference signals and correcting the stored count value on the basis of results of the comparison processing for respective remaining reference signals of the plural kinds of reference signals.

An analog to digital converter (ADC) containing a sub-ADC to resolve at least some of the bits using successive approximation principle (SAP), while providing various improvements. According to one aspect, another sub-ADC is used to resolve some of the bits in parallel. According to another aspect, the sub-ADC using SAP is implemented using a charge redistribution principle, while another sub-ADC does not rely on charge conservation. According to yet another aspect of the present invention, a same component operates as a comparator when the sub-ADC using SAP resolves the corresponding bits, and operates as an amplifier when the sub-ADC generates a residue signal.

An n-bit digital / analog converter is provided for converting an n-bit digital word to a corresponding voltage. The converter comprises an (n-1) bit bufferless switched capacitor digital / analog converter (10) having an output (Vout) for direct connection to a capacitive load (CLOAD). The (n-1) bit converter (10) also has first and second reference voltage inputs (V1, V2) and an (n-1) bit digital input. An (n-1) bit selective inverter (131, . . . , 13n-1, 141, . . . , 14n-1) supplies the (n-1) least significant bits to the digital input and inverts them if the most significant bit has a certain value. A switching arrangement (11, 12) connects the first and second reference voltage inputs (V1, V2) to receive first and second or second and first reference voltages depending on the value of the most significant bit.

The invention discloses a voltage controlled delay chain-based time domain successive approximation digital intelligent battery current detection circuit and a realizing method thereof, belonging to a current detection circuit. In order to solve the problems of low speed and large process difficulty of the traditional intelligent battery detection circuit, the voltage controlled delay chain-based time domain successive approximation digital intelligent battery current detection circuit comprises a sensitive resistor, a level shift circuit, a charge and discharge mark decision circuit, a reference and biasing circuit, a voltage controlled delay chain, an adjustable voltage controlled delay chain, a delay regulation circuit, a time comparer, a time domain successive approximation control logic circuit, a result latch, a clock and a CPU (central processing unit). The realizing method comprises the following steps that: a level signal of the level shift circuit outputs to the voltage controlled delay chain to ensure that an output signal T1 delays one time relevant to the voltage; the delay regulation circuit, the adjustable voltage controlled delay chain, the time comparer and the time domain successive approximation control logic circuit form a feedback circuit, the output of a signal T2 of the adjustable voltage controlled delay chain is regulated until the T2 and the T1 are kept consistent; and the time domain successive approximation control logic circuit latches the output of a digital signal down. The realizing method is used in the intelligent battery current detection circuit.

The method includes defining from all the check nodes at least one group of check nodes mutually connected through at least one second variable node defining an internal second variable node. The method includes performing for each group the joint updating of all the check nodes of the group via a Maximum-A-Posteriori (MAP) type process, and the updating of all the first variable nodes and all the second variable nodes connected to the group except the at least one internal second variable node. The method may include iteratively repeating the updates.