The invention provides a system for testing a diode thermistor in a high speed. The system comprises a material discharging device, a conveying device, a test device, a constant-temperature slot, a material receiving device, a lifting device, an engine seat, a transmission mechanism and a control device; the material discharging device, the conveying device, the test device, the material receiving device, the transmission mechanism and the control device are all arranged on the engine seat; the lifting device and the engine seat are arranged on the floor and the constant-temperature slot is formed on the floor; the material discharging device comprises a material discharging magnetic rail and a material discharging magnetic wheel; the conveying device comprises a chain wheel device, two material discharging chains, a conveying pipe, a feeding magnetic rail, a first stopping device, a second stopping device and a guide block; the test device comprises a test magnetic wheel, a tester and a probe; and the material receiving device comprises a stepping wheel, a material receiving box and a poking sheet. The system is used for testing the diode thermistor, and has high test speed and high stepping precision.