The present invention discloses a method and an apparatus to compute a complex wavefield, referred to as the
object wave o, by means of measuring the intensity
signal resulting from the interference of the said
object wave with a second wave termed the
reference wave. The second wave r is assumed to have some non-vanishing mutual coherence with the said
object wave o. The
reference wave can be obtained from a source or from the object wave itself. The wave may be emitted from sources of variable
degree of coherence and can be scattered
waves, but also light-emitting molecules, matter
waves such as
electron beams or acoustical sources. The disclosed method relates to the said “non-linear method” (NLM). The innovation resides in the fact that the NLM improves considerably the bandwidth of the
wavefront reconstructed from off-axis interferograms and holograms obtained in a
single shot. The
advantage is the significant improvement of the resolution of the images obtained from the reconstructed
wavefront, i.e. amplitude and phase images. The said method also suppresses the artifacts resulting from the intensity recording of interferograms and holograms. The method is general in the sense that it can be used for any interferometric measurement, provided that it satisfies the simple requirement that the intensity of the
reference wave is larger than the intensity of the object wave, and that the object wave modulated by the reference is confined to at least a quadrant of the spectrum. The disclosed method applies to
interferometry,
holography in
optics,
electron waves and
acoustics. In particular, it can be implemented in phase,
fluorescence,
luminescence,
electron and
acoustic microscopy.