The invention relates to a testing device, in particular to a labor-saving testing device for an integrated circuit board. The technical problem to be solved by the present invention is to provide a labor-saving testing device for integrated circuit boards which is convenient to take and place, labor-saving to operate, and capable of testing multiple integrated circuit boards at the same time. In order to solve the above-mentioned technical problems, the present invention provides such a labor-saving testing device for integrated circuit boards, which includes a bracket, a test seat, a lifting mechanism, a moving mechanism, a cylinder, a first pressure rod, etc.; The left side of the bracket is provided with a lifting mechanism, the upper part of the bracket is symmetrically connected with the first slide rail, and the first slide rail is slidably connected with the first slider, and the first slider cooperates with the first slide rail. A moving mechanism is connected between the first sliders on both sides. The invention designs a labor-saving testing device for integrated circuit boards. The setting of the lifting mechanism is conducive to conveniently adjusting the heights of the cylinder and the first pressure rod, so as to test the integrated circuit boards.