813results about "Instrument screening arrangements" patented technology

A cable includes an inner conductor, an inner dielectric, and a guard conductor, where the inner dielectric is between the inner conductor and the guard conductor. The cable also includes an outer dielectric, and a shield conductor, where the outer dielectric is between the guard conductor and the shield conductor. The cable further includes an additional layer of material between the outer dielectric and the shield conductor of suitable composition for reducing triboelectric current generation between the outer dielectric and the shield conductor to less than that which would occur were the outer dielectric and the shield conductor to directly adjoin each other.

An integrated circuit current sensor includes a lead frame having at least two leads coupled to provide a current conductor portion, and a substrate having a first surface in which is disposed one or more magnetic field sensing elements, with the first surface being proximate to the current conductor portion and a second surface distal from the current conductor portion. In one particular embodiment, the substrate is disposed having the first surface of the substrate above the current conductor portion and the second surface of the substrate above the first surface. In this particular embodiment, the substrate is oriented upside-down in the integrated circuit in a flip-chap arrangement. The current sensor can also include an electromagnetic shield disposed between the current conductor portion and the magnetic field sensing elements.

An integrated current sensor includes a current conductor, a magnetic field transducer, and an electromagnetic shield. The magnetic field transducer includes a sensor die. The electromagnetic shield is disposed proximate to the sensor die. The electromagnetic shield has at least one feature selected to reduce an eddy current in the electromagnetic shield.

A current sensor assembly includes a sensor coil, an electrostatic shield coil, a core, a housing, and a magnetic shield. The sensing coil, electrostatic shield coil, core, housing, and magnetic shield can be of toroidal symmetry and arranged coaxially about a pair of primary current conductors. The conductors can be either asymmetric or symmetric with respect to the geometric center of the remaining sensor assembly. The core and a secondary winding make up a current sensor. The core is cylindrically shaped and fabricated of non-magnetic material. The secondary winding is wound over the cylindrical core to form a toroidally shaped winding. When assembled into the current sensor assembly, the core and windings are disposed around two single turn primary windings through which AC currents to be measured flow. Alternatively, the conductor can be flat and the sensor can be a solid state sensor that includes an electrostatic shield. The conductor can have a magnetic flux concentrator positioned about the conductor in the same region where the sensor is located.

An integrated circuit current sensor includes a lead frame having at least two leads coupled to provide a current conductor portion, and a substrate having a first surface in which is disposed one or more magnetic field sensing elements, with the first surface being proximate to the current conductor portion and a second surface distal from the current conductor position. In one particular embodiment, the substrate is disposed having the first surface of the substrate above the current conductor portion and the second surface of the substrate above the first surface. In this particular embodiment, the substrate is oriented upside-down in the integrated circuit in a flip-chap arrangement. The current sensor can also include an electromagnetic shield disposed between the current conductor portion and the magnetic field sensing elements.

A probe card assembly is disclosed. The probe card assembly comprises a stiffener ring combining respectively with an upper printed circuit board and a lower printed circuit board. A plurality of coaxial transmitters are installed in the stiffener ring, and connect to the upper and lower printed circuit boards by cable connectors. The lower printed circuit board is assembled with a detachable probe head which comprises a silicon substrate with probing points and a probe head carrier. A downset is formed at the center of the probe head carrier. The standardized coaxial transmitters, printed circuit boards and probe heads are then assembled as a probe card assembly for testing all sorts of IC products.

A probe station with an improved guarding structure.

The invention relates to a chuck apparatus for a wafer probe station in which the central conductive surface supports a device-under-test (DUT) over a conductive lower chuck portion. An insulator positions the center conductor surface of the chuck above the lower chuck portion and also positions an electrically isolated conductor along its periphery. A laterally extending shielding element is provided for shielding electromagnetic interference (EMI) from the center conductor surface and the lower chuck portion. The electrically isolated conductor and the conductive lower chuck portion may cooperate to form a line-of-sight electrical barrier between the center conductor surface and the laterally extending shielding element. The invention further relates to methods of manufacturing the chuck apparatus and using the apparatus to accomplish low current and voltage tests in a probe station.

A capacitive detection device (20) for a vehicle comprises a sensing electrode (26) for generating an oscillatory electric field in a detection space and a shielding electrode (28) arranged on a side of the sensing electrode turned away from the detection space. The capacitive detection device comprises a circuit ground and a ground connector for connecting the circuit ground to chassis ground of the vehicle. At least one shunt capacitor is connected between circuit ground and the shielding electrode. The at least one shunt capacitor has a capacitance at least 25 times higher than the capacitance between the shielding electrode and the chassis ground of the vehicle.

There is described a system to measure the electrical consumption of a household. This system consists of a network of measuring devices that are attached to wires between electrical appliances and circuit breakers and of a communication and processing unit that receives measurement data from the measuring devices. Low precision sensors based on the Hall effect may be used for obtaining precise measurements of energy consumption by providing a casing for the measuring devices that ensures a fixed, known, and precise alignment with respect to the wire to which it is attached. Low precision sensors based on the Hall effect may also be used by performing a correction calibration of measured data.

A ground fault detection system based on capacitive sensing suitable for use in detecting a ground fault condition in electronic equipment (such as a PCBA) with a circuit ground electrically isolated from an isolation ground (such as chassis ground). The capacitive sensing system includes a capacitive sensor capacitively coupled to the system isolation ground, and a capacitance / data converter that captures sensor capacitance measurements for conversion to sensor data representative of a ground short. In one embodiment, the capacitive sensor includes a sensor electrode capacitively coupled to the system isolation ground by one of projected capacitance and a floating capacitor (such as 33 pf), and the CDC unit further includes sensor excitation circuitry configured to drive the sensor electrode, such that a sensor capacitance (projected or floating capacitance) is representative of an electrical condition of the system isolation ground. For sensing by projected capacitance, the capacitive sensor can include a driven shield.

A voltage sensor for measuring the voltage on high voltage lines is formed by an electrically isolating-section of material with resistive shielding (RS) that structures the electric field generated by a voltage difference between the two ends of the isolating-section and provides shielding of the internal electric field from sources of electric field interference external to the voltage sensor. At least one electric field sensor is provided to sense the electric field in the isolating-section the output(s) of which is(are) used to infer the voltage difference.

A probe needle apparatus having a conductive central core with alternating layers of dielectric and conductive materials is provided. The apparatus includes the conductive central core, a first layer of dielectric material applied to maintain electrical access to the conductive central core while providing continuous isolation of the conductive central core elsewhere, and a conductive driven guard layer applied around the first layer of dielectric material in electrical isolation from the conductive central core. The conductive driven guard layer is applied on the first layer of dielectric material with a mask on an end of the conductive central core to prevent the conductive driven guard layer from touching the conductive central core.

A torque index sensor according to an embodiment of the present invention includes a rotor rotating with the first shaft which is one of an input shaft and an output shaft having a first magnet on an outer circumferential surface thereof, a stator disposed on an outer side of the first magnet and rotating with the second shaft which is the other of the input shaft and the output shaft, a shield disposed on a lower side of the stator and rotating with the second shaft and a second magnet combined with a lower side of the shield and rotating with the second shaft. The torque index sensor shields magnetic field interference and improves operational reliability.

To reduce noise in measurements obtained by probing a device supported on surface of a thermal chuck in a probe station, a conductive member is arranged to intercept current coupling the thermal unit of the chuck to the surface supporting the device. The conductive member is capacitively coupled to the thermal unit but free of direct electrical connection thereto.

A voltage sensor housing includes a top portion including a conductive top portion composed of conductive material and non-conductive top portions composed of non-conductive material, a bottom portion composed of non-conductive material, side portions composed of non-conductive material, wherein the top portion the bottom portion and the side portions define an interior area structured to hold a voltage sensor, and conductive side portions composed of conductive material and being disposed adjacent to the side portions. The conductive top portion is electrically floating and the conductive side portions are electrically grounded.

A current sensor includes a magnetic detection element configured to detect magnetism produced from a current path and a magnetic shield core. The magnetic shield core includes a core portion arranged so as to extend around the current path such that the current path is positioned therein, a gap portion formed by cutting a part of the core portion and in which the magnetic detection element is arranged, and at least a pair of shield portions extending from the core portion toward the outside opposite to the inside of the core portion where the current path is arranged, so as to correspond to the magnetic detection element.

A shielded probe apparatus is provided with a shielded probe and a tri-axial cable that are electrically connected within a shielded chassis. The shielded probe apparatus is capable of electrically testing a semiconductor device at a sub 100 fA operating current and an operating temperature up to 300 C.

The invention discloses a testing system and a testing method, suitable for testing a DUT with double-sided signal pins. The testing system includes a testing platform and a pick-and-place device. The testing platform includes an electromagnetic shielding chamber and a test-bench module. The electromagnetic shielding chamber has an opening. The test-bench module is disposed in-between the electromagnetic shielding chamber. The pick-and-place device is movably disposed above the testing platform. The pick-and-place device includes an electromagnetic shielding cap and a signal transmission structure. When the pick-and-place device places the DUT on the test-bench module, the electromagnetic shielding cap cooperates with the electromagnetic shielding chamber of the testing platform to form an isolated space for isolating the DUT, and furthermore, the signal pin disposed on an upper surface of the DUT can be electrically connected to the test-bench module through the signal transmission structure.

A current sensor includes a folded-shaped current path including a pair of arm portions extending in parallel with each other, and a pair of magnetoelectric conversion elements provided so as to sandwich therebetween a symmetric axis passing between the pair of arm portions, the pair of magnetoelectric conversion elements being used for detecting magnetism caused by a current passing through the pair of arm portions, wherein a half-bridge circuit in which the pair of magnetoelectric conversion elements is series-connected and a signal is able to be extracted from a connection point between the pair of magnetoelectric conversion elements is formed, and sensitivity axes of the pair of magnetoelectric conversion elements are oriented in a same direction and sensitivity-influencing axes of the pair of magnetoelectric conversion elements are oriented in a same direction.

A device for measuring differential current designed to measure differential current in at least two current lines, comprising a first magnetic circuit designed to surround the current lines, forming a primary circuit of a transformer, a first secondary winding wound around said magnetic circuit and forming the secondary circuit of the transformer, a metal shielding surrounding the first secondary winding and the magnetic circuit. The device for measuring differential current in addition comprises at least one second secondary winding surrounding at least a part of the metal shielding. This second winding forms a second magnetic circuit of at least one second current sensor designed to supply an electric signal representative of a current flowing in at least one current line.

Provided is a test system that tests a device under test, the test system including: a test head that includes a test module that generates a test signal to be supplied to the device under test; a performance board that is mounted above the test head and conveys the test signal generated by the test module; and a daughter unit that is detachably mounted to the performance board, and conveys the test signal from the performance board to the device under test, where the daughter unit includes: a socket to which the device under test is mounted; a daughter board to which the socket is mounted; and an enclosure that accommodates therein the socket and the daughter board, and includes a daughter-unit shield that cuts off noise from outside with respect to the socket and the daughter board.

An apparatus includes a device contactor having an integrated radio frequency (“RF”) shield and a gasket coupled to a first surface of the device contactor. When the device contactor is removably attached to a printed circuit board (“PCB”), the gasket contacts the PCB, and the RF shield and the gasket form a Faraday cage that shields a device under test and / or circuitry associated with the device under test from RF noise.

A wireless sensor device (10) for a high-voltage environment, which device (10) comprises a housing (12), a control unit (18) for monitoring one or more variable(s) (T) and a power supply unit (20), wherein the housing (12) is designed such that an electric field (E) is minimized and the communication unit (16) is arranged partly inside the housing (12).

The electromagnetic field shielding apparatus of the present invention includes the electromagnetic field detection coil 21 for detecting an AC leakage electromagnetic field and the parallel resonance circuit 22-24 whose circuit constants are predetermined so that the resonance frequency matches the frequency of the electromotive force induced by the electromagnetic field detection coil 21. The resistor 24 of the parallel resonance circuit 22-24 consumes energy so that the strengths of the magnetic and electrical fields passing through the electromagnetic field detection coil 21 are suppressed.

A flicker noise test system includes a guarded signal path and an unguarded signal path selectively connectable to respective terminals of a device under test. The selected signal path is connectable a terminal without disconnecting cables or changing probes.