48 results about "Pattern search" patented technology

A computer-based method for identifying patterns in computer text using structures defining types of patterns which are to be identified, wherein a structure comprises one or more definition items, the method comprising assigning a weighting to each structure and each definition item; searching the computer text for a pattern to be identified on the basis of a particular structure, a pattern being provisionally identified if it matches the definition given by said particular structure; in a provisionally identified pattern, determining those of the definition items making up said particular structure that have been identified in the provisionally identified pattern; combining the weightings of the determined definition items and optionally, the weighting of the particular structure, to a single quantity; assessing whether the single quantity fulfils a given condition; depending on the result of said assessment, rejecting or confirming the provisionally identified pattern.

Inspection guided overlay metrology may include performing a pattern search in order to identify a predetermined pattern on a semiconductor wafer, generating a care area for all instances of the predetermined pattern on the semiconductor wafer, identifying defects within generated care areas by performing an inspection scan of each of the generated care areas, wherein the inspection scan includes a low-threshold or a high sensitivity inspection scan, identifying overlay sites of the predetermined pattern of the semiconductor wafer having a measured overlay error larger than a selected overlay specification utilizing a defect inspection technique, comparing location data of the identified defects of a generated care area to location data of the identified overlay sites within the generated care area in order to identify one or more locations wherein the defects are proximate to the identified overlay sites, and generating a metrology sampling plan based on the identified locations.

A computer-based method for identifying patterns in computer text using structures defining types of patterns which are to be identified, wherein a structure comprises one or more definition items, the method comprising assigning a weighting to each structure and each definition item; searching the computer text for a pattern to be identified on the basis of a particular structure, a pattern being provisionally identified if it matches the definition given by said particular structure; in a provisionally identified pattern, determining those of the definition items making up said particular structure that have been identified in the provisionally identified pattern; combining the weightings of the determined definition items and optionally, the weighting of the particular structure, to a single quantity; assessing whether the single quantity fulfils a given condition; depending on the result of said assessment, rejecting or confirming the provisionally identified pattern.

A computer-readable instruction is described for traversing deterministic finite automata (DFA) graphs to perform a pattern search in the in-coming packet data in real-time. The instruction includes one or more pre-defined fields. One of the fields includes a DFA graph identifier for identifying one of several previously-stored DFA graphs. Another one of the fields includes an input reference for identifying input data to be processed using the identified DFA graphs. Yet another one of the fields includes an output reference for storing results generated responsive to the processed input data. The instructions are forwarded to a DFA engine adapted to process the input data using the identified DFA graph and to provide results as instructed by the output reference.

The embodiments herein relate to multi pattern searching and, more particularly, to multi pattern search or multi pattern matching using logic content processing. The input pattern is type cast to a Boolean alphabet and is then processed to create a corresponding signature set. Further, the signature set is divided into subsets and a Boolean logic function representing each signature subset is created. Further, the values of each subset are simultaneously compared with windows of an input data steam or data file to find a match. If a match is found, the system returns a hit, else a miss. Parallel stages may be added to enhance performance of the system, as multiple inputs may be processed at a time.

A method searches for new, unique and interesting information using knowledge patterns discovered through data mining and text mining, machine learning (including supervised or unsupervised) and pattern recognition methods. The method is implemented as a computer program acting as an agent installed in a computer node or multiple nodes in a networked environment. The system is useful for improving search experience and used in knowledge discovery applications when new, unique and interesting information is critical. The system is also useful for introducing new concepts and products for business applications.

A method and apparatus for determining the quality of a block match for a candidate motion vector in a video encoder system using motion vectors representing the difference in coordinates of a macroblock of data in a current frame of video data and coordinates of a related macroblock of data in a reference frame of video data. The method can include defining a search pattern, searching a region based on the search pattern for a candidate motion vector for evaluation, calculating a difference metric, calculating a bias based on the difference between a predictor motion vector and a candidate motion vector, determining a modified difference metric by adding the difference metric to the bias, and defining a final motion vector based on the modified difference metric.

The invention provides a quick inter-frame prediction mode selection method for AVS-M video coding. Algorithms can be classified according to the distribution situation of inter-frame coding modes and are arranged according to processing priority, different types are judged sequentially, possible modes are compared selectively, and the number of modes to be judged is reduced. Early termination judgment is utilized to carry out priority judgment on an SKIP mode, and whether other modes are early termination is judged through threshold value judgment. If threshold value judgment conditions are met, the SKIP mode is directly utilized to code. If the threshold value judgment conditions are not met, an Inter4*4 mode, an Inter 8*8 mode and an Inter 16*16 mode are used as initial modes. A part of macro block modes are removed according to whether rate-distortion cost meets monotony, and accordingly useless block mode search processes are reduced. Compared with a full-mode selection algorithm, the calculating times is reduced by 52.5% to 85.8%, and the calculating complexity of inter-frame forecasting modules is reduced.

A system, method and program product that utilizes flat pattern based L3GO elaboration in a hierarchical environment to create a nested conventional layout. A system is provide for processing a glyph layout to generate shapes for use in a VLSI (very large scale integrated circuit) design process, including: a hierarchical pattern search system that matches patterns from a pattern library to a set of glyph data, wherein the patterns have dependencies that cross hierarchical design boundaries; and a target shape generation system that selects patterns from a set of matching patterns and generates associated shapes.

A system for searching stored audio data is described. The system includes a memory configured to store audio data received from a radio receiver and a processing circuit. The processing circuit is configured to receive a search pattern, search the stored audio data for the search pattern, and provide audio data based on the search.

Methods and systems for pattern search and analysis to identify and select therapeutic molecules that can be used to treat bacterial infections or contaminations are disclosed. Examples include methods and systems for pattern search and analysis to identify and select bacteriophage based on comparison of the genomes of a query bacterium and / or a query phage strain to a therapeutic molecule-host training set of bacterial strains and / or phage strains in which the phage strains (or other therapeutic molecules) have been shown to have the capacity to act as an antibacterial agent by either killing, replicating in, lysing and / or inhibiting the growth of the bacterial strains in the training set. Therapeutic compositions, including phage, identified using the methods described herein can then beused to treat bacterial infections in a subject and / or contamination in the environment.

The invention discloses a target pattern searching method and a computer-readable storage medium, wherein the method comprises the steps of according to a preset zooming algorithm, zooming an originalimage to each preset resolution for obtaining a zoomed image of the original image in each preset resolution; according to a preset matching algorithm, performing target pattern template matching oneach zoomed image for obtaining a matching score of each original image in each preset resolution; and selecting the template matching result with highest matching score as an output result, wherein the matching result comprises positioning data of the target pattern. The method according to the invention settles a technical problem of low matching effect when a difference between the dimension ofthe target pattern in the original image and the dimension of the template pattern used in the template matching algorithm is relatively large.

Some embodiments of the invention provide a data plane circuit for a network forwarding element that searches for one or more patterns of characters stored in data messages received by the data plane circuit. In some embodiments, the data plane circuit analyzes the data messages as it processes the data messages to forward the data messages to their destinations in a network. Because the data messages are already flowing through the network, it is optimal to search the data messages for the character patterns as the data messages pass through the network, instead of performing these operations on a separate set of servers that typically perform these searches at slower rates. In other embodiments, the data plane circuit does not perform its character pattern searches in conjunction with its forwarding operations, as it receives the data messages from a set of servers just for the purpose of performing its character pattern searches, in order to offload some or all of these searches from the server set.

The invention discloses a grayscale image matching method and device for geographic image splicing. The method comprises the steps of carrying out the polar coordinate conversion of a first geographicimage, and obtaining a first data string which uniquely represents the first geographic image; obtaining the contour of a target pattern in a second geographic image; selecting a matching area with the same size as the first geographic image from a target pattern search area, carrying out polar coordinate conversion on the matching area, and obtaining a second data string uniquely identifying thematching area; calculating the similarity between the first data string and the second data string; and until similarity calculation of all the matching areas is completed, selecting the matching area with the maximum similarity as a target pattern, and acquiring the position and direction of the target pattern. According to the method, the matching search range is narrowed through preprocessing,and the matching speed is increased; pixel points are sequentially combined and calculated to obtain the only data string representing the image, so that the data are reduced, unique and accurate, and the matching speed and accuracy are improved.

A motion estimation method for a succession of frames in a digital coding system includes: a) with reference to a first block in a first frame, searching a second frame for a second block that corresponds to the first block; and b) estimating a motion vector of the first block on the basis of the second block in the second frame; wherein step a) includes: a1) forming a first initial search range including a virtual rhombus-shaped pattern substantially centered at a pre-determined block, and a2) expanding progressively outward a second initial search range based on the virtual rhombus-shaped pattern.

Determining intersection points of parameter patterns. Parameter patterns are specified in a query. A method includes identifying a first parameter pattern from the query as occurring less often in the index than one other parameter pattern in the query. The data store is searched until a present location of the data store has been identified as including the first parameter pattern. Then the data store is searched for a location of another parameter pattern. If the present location is identified as including the another parameter pattern, then an indication is provided identifying an intersection. Otherwise, the method includes continuing searching remaining portions of the data store to find a location of the another parameter pattern at a new present location. At least one of the acts of searching above includes eliminating at least a portion of records of the data store from searching without being searched prior to being eliminated.

The invention discloses an energy management system control method and an energy management system control device. The method comprises the following steps: collecting m sets of data of the control parameters of a system, and calculating comprehensive control energy efficiency data of the system; building a fitting function; with the fitting function as an objective function, using a pattern search optimization algorithm to search for an optimal solution of the control parameters; and controlling the operation of the system according to the optimal solution of the control parameters. Through the energy management system control method and the energy management system control device of the invention, energy saving of the system is optimized, the energy efficiency is increased, and energy conservation and emission reduction are achieved.

The invention discloses an anti-radiation RS code decoding circuit. The circuit comprises: an adjoint calculation module used for calculating the received code word R(x) to obtain an adjoint polynomial S(x); a key equation solving module used for carrying out key equation solving on the adjoint polynomial S(x) to obtain an error position polynomial [lambda](x) and an error value polynomial [omega](x); an error pattern searching module used for calculating to obtain an error position and an error value corresponding to the error position; a data caching module used for caching the received codeword R(x); and an error correction output module used for reading the code word R(x) cached in the data caching module, performing error correction on the read cached code word R(x) according to theerror position calculated by the error pattern search module and the error value corresponding to the error position, and outputting a code word C. According to the anti-radiation RS code decoding circuit, the area of the circuit is reduced, the power consumption of the circuit is reduced, and the reliability of the circuit is enhanced while the performance of the circuit is improved.

The invention discloses a method for optimizing the thickness of a multi-layer heat insulation medium. The method comprises the following steps: 1, for a given thermal insulation material with n layers of media, wherein n is a positive integer, establishing a heat conduction model based on the law of conservation of energy and the Fourier law; 2, selecting the thickness of the ith layer as an optimization target, constructing an index function, and establishing a corresponding optimization problem, wherein i is positive integer and is greater than or equal to 1 and less than or equal to n; and3, carrying out numerical solution on the optimization model based on a mode search method to obtain the optimal thickness of the ith layer of medium. The optimal medium thickness is determined through a numerical experiment mode, the research and development cost is reduced, and the research and development period is shortened.

A system, method and program product that utilizes flat pattern based L3GO elaboration in a hierarchical environment to create a nested conventional layout. A system is provide for processing a glyph layout to generate shapes for use in a VLSI (very large scale integrated circuit) design process, including: a hierarchical pattern search system that matches patterns from a pattern library to a set of glyph data, wherein the patterns have dependencies that cross hierarchical design boundaries; and a target shape generation system that selects patterns from a set of matching patterns and generates associated shapes.

The invention relates to a test case generation method and device, electronic equipment and a storage medium, and the method comprises the steps that an original log generated when target software runs is obtained, the original log is preprocessed to obtain an interface parameter pair set, and any interface parameter pair in the interface parameter pair set comprises an interface and a calling parameter of the interface; frequent pattern searching is carried out on a plurality of interface parameter pairs in the interface parameter pair set to screen out a plurality of target interface parameter pairs, and a target interface contained in any target interface parameter pair and a target calling parameter of the target interface meet a preset frequent condition; and test cases for testing the target interfaces are generated according to the target interface parameter pairs. According to the scheme, the test scene coverage of the test case can be improved, automatic generation of the test case can be realized, and the software test efficiency can be improved to a certain extent.

The invention discloses a global mode search method for the optimal control problem of a two-degree-of-freedom manipulator. First, several points evenly distributed are calculated in the search space, and iterative search is carried out near the point with the minimum function value. This search method not only has the fast iterative characteristics of the traditional pattern search method, but also makes the obtained optimal point globally optimal in the entire search space, which improves the practicability of the search method. In addition, the present invention uses the existing point set to calculate the simplex gradient after each iterative search, and designs a new search vector set according to the simplex gradient, so that the search vector of each iteration can more accurately reflect the gradient descent of the objective function direction, thereby further reducing the search cost and increasing the search rate.

The invention discloses a two-dimensional coding trap set error pattern search method, which comprises the following steps of: firstly, setting a received codeword C matrix, and setting a bit elementcorresponding to an error codeword to be 0; searching a first candidate column in the matrix C to obtain a P matrix, searching a first candidate row to obtain a P1 matrix, performing iterative searchto obtain a Pk matrix, generating a matrix PM-1 according to the above steps, traversing all column and row combinations according to the above steps until conditions cannot be met, indicating that the matrix does not have a trap set, and ending the search. According to the two-dimensional coding trap set error pattern searching method provided by the invention, trap set error patterns can be effectively searched and estimated.

Systems and methods for automatic correction of drift between inspection and design for massive pattern searching are disclosed herein. Defects are identified in a scan of a wafer. The defects are associated with tool coordinates. An SEM review tool captures centered images of the defects. The SEM review tool is aligned with the wafer using design polygons in an imported design file. Design coordinates are exported and used to define patterns of interest and identifying locations of those patterns of interest.

The present invention addresses the problem of quickly specifying an optical condition of an inspected object, namely a wafer, and in particular, accelerating optical condition setting after obtaining a customer wafer. An inspection apparatus automatic adjustment system according to the present invention comprises: an analysis condition setting IF (102) which inputs analysis conditions; an analysis execution unit (103) which performs analysis; an inspection device model and model DB (101) used for analysis; an analysis result DB (104) that stores analysis results; an observation condition setting IF (105) which inputs a wafer pattern, a focus point, an optimization index, and a priority; a wafer pattern search unit (106) which searches for a wafer pattern similar to the input wafer pattern; an optical condition extraction unit (107) which extracts, from the analysis result DB (104), the optimum optical condition for the similar wafer pattern and the focus point; and an optical condition setting unit (108) which generates a control signal corresponding to the optical condition and transmits the control signal to the inspection apparatus.

The present invention addresses the problem of quickly specifying an optical condition of a wafer to be inspected, and in particular, accelerating optical condition setting after obtaining a customer wafer. An inspection apparatus automatic adjustment system according to the present invention comprises: an analysis condition setting interface 102 which inputs analysis conditions; an analysis execution unit 103 which performs analysis; an inspection device model and model DB 101 used for analysis; an analysis result DB 104 that stores analysis results; an observation condition setting interface 105 which inputs a wafer pattern, a focus point, an optimization index, and a priority; a wafer pattern search unit 106 which searches for a wafer pattern similar to the input wafer pattern; an optical condition extraction unit 107 which extracts, from the analysis result DB 104, the optimum optical condition for the similar wafer pattern and the focus point; and an optical condition setting unit 108 which generates a control signal corresponding to the optical condition and transmits the control signal to the inspection apparatus.

The present invention provides a system and method for constructing a parallel pattern search space. The method includes: initializing the input logical tensor; calculating and outputting the true value of the logical tensor; constructing all candidate parallel patterns, and determining the iteration content of the input and output tensor parallel patterns; combining Input the tensor parallel mode iteration content, split the input logical tensor into physical tensor; judge the legality of the physical tensor calculation, if legal, calculate the physical tensor result and output it; if illegal, continue to input the tensor parallel mode iteration process; Combining the iteration content of the output tensor parallel mode, merge the physical tensor operation result into a logical tensor; compare the logical tensor truth value with the logical tensor, if they are equal, add the parallel mode to the legal parallel mode search space, and directly continue to input the tensor If they are not equal, continue the iterative process of the output tensor parallel mode until the iteration is completed, repeat the above steps until the input tensor parallel mode iterative process is completed.