The invention discloses a method for controlling a power supply of an
electron-optical circuit
system of an
electron beam furnace and a power supply device. The method takes the extraction value of an
acceleration voltage sampling
signal of a power supply of an
electron beam generating
system as a
control signal for a focusing and deflection scanning power supply and the amplitude of a focusing and deflection scanning current changes linearly according to the
control signal, which ensures that the operation parameter of the electron-optical circuit
system is free from the influence of the fluctuation of the
acceleration voltage. The power supply device has the
acceleration voltage sampling
signal connected with a square root extractor first and then connected to a focusing and deflection scanning power supply
control circuit, and adopts a
hysteresis-band current tracking pulse modulation controller to maintain a small up and down
oscillation amplitude of a working current based on an expected value. An extraction value
signal of the acceleration
voltage sampling signal is used to control a focusing current, and a general
control signal which is the produce of a deflection scanning integrated signal and the extraction value of the acceleration
voltage sampling signal is used to control deflection scanning current, so the focusing and deflection scanning region of the electron beam is not influenced by the acceleration
voltage, and in event of failure, the change of the focusing and deflection scanning region of the electron beam is controlled in a permitted range.