107 results about "Design under test" patented technology

Methods and apparatus are provided for verifying and validating operation of a design under test (DUT). Input data sequences having information used to check expected outputs are provided to a DUT. The input data sequences include checking headers and data. The checking headers and data are randomized using encryption to verify and validate operation of the DUT on a variety of bit sequences. Different keys are used to allow further scrambling.

System, methods, and apparatus for verifying microcircuit designs by interleaving between random and formal simulation techniques to identify input traces useful for driving designs under test into sequences of device states. In a method aspect the invention provides process for beginning random simulation of a sequence of states of a microcircuit design by inputting a sequence of random input vectors to a design under test model in order to obtain a sequence of random simulation states; monitoring a simulation coverage progress metric to determine a preference for switching from random simulation to formal methods of simulating states in the design under test; beginning formal simulation of states in the design under test and monitoring a formal coverage progress metric to determine a preference for resuming random simulation of states of said microcircuit design; and resuming random simulation. Preferably the process of interleaving simulation methods continues until an input vector suitable for driving the design under test model into each of a set of previously-identified goal states has been obtained.

An emulation-based event-wait simulator including an application module to configure and command verification processes on a design under test (DUT). An event dispatcher is in communication with the application module to deliver commands to the DUT. A plurality of transactors are in communication with the event dispatcher to forward the commands to the DUT. A channel controller is in communication with the transactors to process and forward the commands to the DUT, wherein the channel controller also receives messages from the DUT, processes the messages, and forwards the messages to the transactors for delivery to the event dispatcher and the application module.

Methods and systems are disclosed that enhance the ability of a test generator to automatically deal with address translation in a processor design, and without need for creating specific code. A model of the address translation mechanism of a design-under-test is represented as a directed acyclic graph and then converted into a constraint satisfaction problem. The problem is solved by a CSP engine, and the solution used to generate test cases for execution. Using the model, testing knowledge can be propagated to models applicable to many different designs to produce extensive coverage of address translation mechanisms.

Methods and systems are disclosed that enhance the ability of a test generator to automatically deal with address translation in a processor design, and without need for creating specific code. A model of the address translation mechanism of a design-under-test is represented as a directed acyclic graph and then converted into a constraint satisfaction problem. The problem is solved by a CSP engine, and the solution used to generate test cases for execution. Using the model, testing knowledge can be propagated to models applicable to many different designs to produce extensive coverage of address translation mechanisms.

A system and method is presented for synthesizing both a design under test (DUT) and its test environment (i.e., the testbench for the DUT), into an equivalent structural model suitable for execution on a reconfigurable hardware platform. This may be achieved without any change in the existing verification methodology. Behavioral HDL may be translated into a form that can be executed on a reconfigurable hardware platform. A set of compilation transforms are provided that convert behavioral constructs into RTL constructs that can be directly mapped onto an emulator. Such transforms are provided by introducing the concepts of a behavioral clock and a time advance finite state machine (FSM) that determines simulation time and sequences concurrent computing blocks in the DUT and the testbench.

A fully synthesizeable Simulation Control Module (SCM) controls and monitors the simulation of a design under test (DUT). A clock generator within the SCM and a Software clock facility residing on the host workstation are responsible for providing the clocks for the DUT. The SCM and the hardware clock facility are dynamically generated at build time to suit the needs of the DUT. They maximize performance by automatically generating clock waveforms for designs containing multiple asynchronous clocks, thereby decreasing the frequency of accelerator-workstation interaction. The software clock facility has the ability to directly drive the DUT and is responsible for managing the simulation time and clock parameters. The SCM is also responsible for monitoring an abort condition such as a trigger to execute an external software model. The SCM and the clock facilities allow the hardware accelerator to efficiently support multiple asynchronous clock domains, execution of external software models and co-simulation.

For a design under test (DUT) that is to be emulated, a host system partitions the DUT into multiple partitions and maps each partition to an FPGA of an emulator which will emulate the partition. The host system stores information describing to which FPGAs each component of the DUT has been mapped. Additionally, mapped to each FPGA is trace and injection logic that traces signals exchanged by the FPGA with other FPGAs during emulation of the DUT. After the emulation of the DUT is complete, if a user wishes to debug a component of the DUT, the FPGAs that are configured to emulate the component are identified. For each identified FPGA, the trace and injection logic injects previously traced signals into the logic of the FPGA in order to reemulate the component. The host system generates waveforms for the user that include signals traced during the reemulation of the component.

An emulation-based event-wait simulator including an application module to configure and command verification processes on a design under test (DUT). An event dispatcher is in communication with the application module to deliver commands to the DUT. A plurality of transactors are in communication with the event dispatcher to forward the commands to the DUT. A channel controller is in communication with the transactors to process and forward the commands to the DUT, wherein the channel controller also receives messages from the DUT, processes the messages, and forwards the messages to the transactors for delivery to the event dispatcher and the application module.

Computer-implemented techniques are disclosed for defining an environment for formal verification of a design-under-test. Initially there is extraction of design inputs by a design analysis module, and presentation of the inputs on a graphical user interface. Behavior options for the design inputs are offered on the graphical user interface for selection by an operator. Environment code that is descriptive of the design inputs and selected behavior options is emitted, typically in a hardware description language, for submission to a formal verification tool. A meta-code file containing the assigned behavior options is generated to aid subsequent sessions.

A method for presentation of functional coverage includes representing a set of attributes of a design under test as a multi-dimensional cross-product space, which includes events corresponding to combinations of values of the attributes to be tested, the events including legal and illegal events. At least one test is run on the design, and responsively to the at least one test, a first group of the legal events that were covered by the at least one test and a second group of the legal events that remain non-covered after the at least one test are identified. One or more of the illegal events are grouped with at least one of the first and second groups so as to present a simplified model of the coverage of the events in the cross-product space.

An emulation environment includes a host system and an emulator. The host system configures the emulator to emulate a design under test (DUT) and the emulator emulates the DUT accordingly. During emulation, the emulator traces limited signals of the DUT and stores values of the traced signals. When values of certain signals of the DUT are needed for analysis or verification of the DUT but the signals were not traced by the emulator, the host system simulates one or more sections of the DUT to obtain values of the signals. Signals traced by the emulator are used as inputs to simulate the one or more sections.

A method, computer program product, and data processing system for determining test sequences' coverage of events in testing a semiconductor design are disclosed. Test patterns are randomly generated by one or more “frontend” computers. Results from applying these patterns to the design under test are transmitted to a “backend” computer in the form of an ordered dictionary of events and bitmap and / or countmap data structures. A “bitmap” data structure encodes Boolean information regarding whether or not a given event was covered by a particular test sequence. A “countmap” data structure includes frequency information indicating how many times a given event was triggered by a particular test sequence. The backend computer combines results from each test sequence in a cumulative fashion to measure the overall coverage of the set of test sequences.

A design verification workstation contains both debug and constraint solver capabilities during simulation of a design under test. The design verification workstation is configured to allow the user to debug constraints, stop the constraint solver, navigate problems and variables, and make modifications on-the fly during the simulation to constraint information. Additionally, in some embodiments, the design verification workstation may allow a user to use a constraint solver to experiment if the modifications will lead to desired test stimulus. Since this debug process happens during simulation, users do not need to recompile the test case. Additionally, once a user is satisfied with the modifications made to the simulation, the modification could be saved for future usage.