The invention discloses a
diffraction device and a method for
nondestructive testing of orientation uniformity of crystals in a workpiece, and the device comprises: an X-
ray irradiation system which irradiates X-rays to a measurement part of a measured sample; an X-
ray detection
system for simultaneously detecting a plurality of diffracted X-rays formed by diffracting the X-rays from a plurality of locations of the sample to be measured and measuring the X-
ray diffraction intensity distribution of the sample to be measured, wherein the detected X-rays are short-
wavelength characteristic X-rays, and the X-ray detection
system is an array detection system; the method comprises the following steps: selecting short-
wavelength characteristic X-rays, carrying out texture analysis on a sample tobe detected, and determining a
diffraction vector Q to be detected; and acquiring the X-ray diffraction intensity of the corresponding part of the measured sample. According to the invention, the internal
crystal orientation uniformity of the
centimeter-level thickness workpiece in the whole thickness direction can be rapidly and nondestructively detected, and online detection and characterizationof the internal
crystal orientation uniformity of the
centimeter-level thickness workpiece in the whole thickness direction of the movement track of the
centimeter-level thickness workpiece can be achieved on a
production line.