Diffraction device and method for nondestructive testing of orientation uniformity of crystals in workpiece

Abstract

The invention discloses a diffraction device and a method for nondestructive testing of orientation uniformity of crystals in a workpiece, and the device comprises: an X-ray irradiation system which irradiates X-rays to a measurement part of a measured sample; an X-ray detection system for simultaneously detecting a plurality of diffracted X-rays formed by diffracting the X-rays from a plurality of locations of the sample to be measured and measuring the X-ray diffraction intensity distribution of the sample to be measured, wherein the detected X-rays are short-wavelength characteristic X-rays, and the X-ray detection system is an array detection system; the method comprises the following steps: selecting short-wavelength characteristic X-rays, carrying out texture analysis on a sample tobe detected, and determining a diffraction vector Q to be detected; and acquiring the X-ray diffraction intensity of the corresponding part of the measured sample. According to the invention, the internal crystal orientation uniformity of the centimeter-level thickness workpiece in the whole thickness direction can be rapidly and nondestructively detected, and online detection and characterizationof the internal crystal orientation uniformity of the centimeter-level thickness workpiece in the whole thickness direction of the movement track of the centimeter-level thickness workpiece can be achieved on a production line.

Description

technical field [0001] The invention relates to non-destructive testing, in particular to a diffraction device and a method for non-destructive testing of the uniformity of crystal orientation inside a workpiece by using the diffraction device. Background technique [0002] The document "Research on the Internal Residual Stress and Grain Orientation Uniformity of Pre-stretched Thick Aluminum Plate" published by Zheng Lin et al. in the journal "Precision Forming Engineering" introduces the use of SWXRD-1000 short-wavelength X-ray diffractometer to analyze the thickness of 20mm-25mm thick aluminum plate. Non-destructive measurement of WKα along the K angle by K-angle scanning of stretched aluminum plate at different depths 1 Diffraction intensity distribution characterizing the homogeneity of the internal texture throughout the thickness of a pre-stretched aluminum sheet. However, using this short-wavelength X-ray diffractometer for detection requires scanning and measuring W...

AI Technical Summary

Problems solved by technology

However, using this short-wavelength X-ray diffractometer for detection requires scanning and measuring WKα at 21 K angles at a layer depth 1 After the diffraction intensity, move another layer of the sample to the center of the diffractometer circle, and repeat the scanning at the depth of this layer to measure WKα at 21 K angles 1 Diffraction intensity, until the K-angle scanning measurement of 11 deep layers is completed, and it takes about 0.5 minutes to measure the WKα1 diffraction intensity at each K-angle deep in each layer, a total of about 21*11*0.4 minutes=92 minutes , takes too long

Obviously, this method is neither suitable for the rapid characterization of the uniformity of crystal orientation inside centimeter-level thickness samples, nor is it suitable for the online nondestructive testing of the uniformity of crystal orientation and the uniformity of internal texture in workpieces of commonly used materials on the production line.

In addition, other existing equipment or methods used to detect the uniformity of crystal orientation in centimeter-level samples also have the problems of long detection time and low detection efficiency. It is a challenge in this field to shorten the detection time to less than two minutes. Big technical difficulty

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