The invention relates to a
crystal geometrically necessary
dislocation automatic
analysis method based on
synchrotron radiation. The method comprises the following steps: step one, acquiring a binary map,
diffraction spot calibration information and
crystal orientation information from an original map through the map
processing; step two, establishing a
dislocation dictionary through the crystallographic theory, establishing equipment model and simulating an elongation direction in combination with the
diffraction spot calibration information and the
crystal orientation information so as to obtain a candidate elongation direction; step three, using the binary map, the
diffraction spot calibration information and the
crystal orientation information to compute a diffraction spot elongation or splitting direction and elongation diffraction spot vertex through the graphic computation method of a diffraction map, the position computation method of the diffraction spot position and a
rotation matrix method of the
crystal orientation; step four, computing the diffraction spot elongation or splitting angle through the elongation diffraction spot vertex and the splitting diffraction spot calibration information; step five, identifying and matching the diffraction spot elongation or splitting according to the candidate elongation direction produced through
simulation, computed elongation or splitting direction and elongation or splitting angle.