A multiple, independent top gated
field effect transistor having an improved
electron injection and reduced gate induced barrier lowering effects, and a method that allows for the destruction of metallic carbon nanotubes positioned between the source and drain of a top multi-gate
transistor are provided. The
field effect transistor comprises at least one
carbon nanotube (14) coupled between the first and second electrodes (16, 18) and a first gate material (24) formed over a portion of the at least one
carbon nanotube (14) and spaced apart from the first and second electrodes (16, 18). A
dielectric material (32) is conformally coated on the first and second electrodes (16, 18), the at least one
carbon nanotube (14), and the first gate material (24). A second gate material (36) is conformally coated on the
dielectric material (32). Other exemplary embodiments include one gate (24, 36), three gates (24, 46, 48), and three gates (24, 54, 56; and 24, 66) having the
dielectric layer (52, 56; and 62, 64) portioned with different material characteristics.