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44results about How to "Apparatus can be miniaturized" patented technology

Lens driving apparatus

A lens driving apparatus 1 of the present invention includes a substantially cylindrical yoke 3; a base 5 to which the yoke 3 is attached; a carrier 7 having a lens; a coil 10; and a magnet 13, wherein the carrier 7 is moved in a direction of an optical axis of a lens by electromagnetic force generated by passing current through the coil 10, the base 5 is substantially square-shaped seeing from a plane, the yoke 3 is placed at an inner position of the base 5, the yoke 3 has an outer peripheral wall 3a and an annular inner peripheral wall 3b to be spaced to each other, each magnet is placed between the outer peripheral wall and the inner peripheral wall and at a position corresponding to a base corner portion of the base 5, a space between the outer peripheral wall 3a and the inner peripheral wall 3b positioned at a base side portion 3e is made narrower than a space between the outer peripheral wall 3a and the inner peripheral wall 3b positioned at the base corner portion.
Owner:NEW SHICOH MOTOR CO LTD

Air conditioner and air conditioning system

Provided are an air conditioner with a humidifier and an air conditioning system. The humidifier is modularized within the air conditioner, enabling humidifying to be performed together with air conditioning. Moreover, by providing the humidifier as a module, indoor space utilization efficiency is improved, and a multi-function, low-cost air conditioner can be manufactured. Furthermore, the humidifier can be linked in operation to the air conditioner, allowing air discharged from the air conditioner to be distributed evenly across an indoor space.
Owner:LG ELECTRONICS INC

Radio-frequency heating apparatus and radio-frequency heating method

ActiveUS9398644B2Heat uniformly and efficientlyEfficient and uniform heatingMicrowave heatingInduction current sourcesRadio frequencyInformation acquisition
A radio-frequency heating apparatus includes a phase varying unit to vary the phase of radio-frequency power; and a plurality of antennas which are placed on the same plane in a heating chamber and radiate a plurality of radio-frequency waves. The radio-frequency waves have a predetermined phase difference caused by phase variation in the phase varying unit. A geometry information acquisition unit acquires the geometry of an object; and a control unit controls the phase varying unit so that the radio-frequency waves are in phase in a first mode, and the radio-frequency waves are in opposite phase in a second mode. The control unit switches between the first mode and the second mode based on the acquired geometry information.
Owner:PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO LTD

Visual inspection apparatus, visual inspection method, and peripheral edge inspection unit that can be mounted on visual inspection apparatus

This visual inspection apparatus has a macro-inspection section and a micro-inspection section. In the micro-inspection section, a inspection stage and a microscope are loaded into a loading plate. The inspection stage can be moved in any directions of the X, Y, and Z directions, and can also be rotated in the θ direction. Moreover, a peripheral edge inspection section that acquires an enlarged image of a peripheral edge of wafer W is fixed to the loading plate. The peripheral edge inspection section is arranged so as to image the peripheral edge of wafer W held by the inspection stage.
Owner:OLYMPUS CORP

Semiconductor device low temperature test apparatus using electronic cooling element

A semiconductor device test apparatus, has: a socket, which connects to a semiconductor device undergoing testing mounted thereon; a test tray, which houses the semiconductor device undergoing testing and which is provided, in a position on which the semiconductor device undergoing testing is mounted, with a first electronic cooling element that absorbs heat via one surface thereof and releases heat via the other surface thereof; and a contact block, which is provided with a second electronic cooling element that makes contact with the top of the semiconductor device undergoing testing in a state in which the semiconductor device undergoing testing is mounted on the socket.
Owner:MONTEREY RES LLC

Apparatus and method for manufacturing high purity polycrystalline silicon

An apparatus for manufacturing a high purity polycrystalline silicon is characterized by comprising: a vaporizer 8 of silicon chloride; a fusing evaporator 5 of zinc; a vertical reactor 1 provided with a heating means on the peripheral face thereof; a silicon chloride gas supply nozzle 2 disposed to connect the vaporizer 8 of silicon chloride and the vertical reactor 1 and for supplying a silicon chloride gas supplied from the vaporizer 8 of silicon chloride into the vertical reactor 1; a zinc gas supply nozzle 3 disposed to connect the fusing evaporator 5 of zinc and the vertical reactor 1 and for supplying a zinc gas supplied from the fusing evaporator 5 of zinc into the vertical reactor 1; and an exhaust gas vent pipe 4 connected to the vertical reactor 1, the fusing evaporator 5 of zinc, further comprising: a zinc evaporator 24; a main vertical cylinder part 28 connected to the upper part of the zinc evaporator 24; a solid trapping pipe 32 inserted into the main vertical cylinder part 28; a zinc introducing pipe 36 connected to the solid trapping pipe 32 at an angle; a seal pot 34 disposed to surround the lower end opening portion of the solid trapping pipe 32 and for configuring the bottom face of the solid trapping pipe 32; an induction heater 45 disposed on the peripheral face of the main vertical cylinder part 28 and capable of controlling a temperature; and a gas vent pipe 40 connected to the side wall of the zinc evaporator 24.
Owner:JNC CORP

Evaporating apparatus

InactiveUS20100071623A1Reduce vapor depositionReduction of cost of apparatus costSpindle sealingsVacuum evaporation coatingGas phaseEngineering
Disclosed is an evaporating apparatus for performing a film forming process on a target object to be processed by vapor deposition, wherein a processing chamber and a vapor generating chamber are disposed adjacent to each other, gas exhaust mechanisms for depressurizing an inside of the processing chamber and an inside of the vapor generating chamber are installed, a vapor discharge opening for discharging a vapor of the film forming material is disposed in the processing chamber, vapor generating units for vaporizing the film forming material and control valves for controlling a supply of the vapor of the film forming material are disposed in the vapor generating chamber, and flow paths, which are not exposed to an outside of the processing chamber and the vapor generating chamber, for supplying the vapor of the film forming material generated in the vapor generating units to the vapor discharge opening are installed.
Owner:TOKYO ELECTRON LTD

Sample Analysis Method and Solution to be Used Therein

Provided are a sample analysis method using capillary electrophoresis capable of enhancing analysis accuracy, a solution for capillary electrophoresis, and a sample analysis kit. The sample analysis method includes separating and / or detecting a substance to be analyzed in a sample through capillary electrophoresis, in which the substance to be analyzed is separated and / or detected in the presence of a pH buffer substance and a non-surfactant-type zwitterionic substance. Further, the solution for capillary electrophoresis contains a pH buffer substance, a non-surfactant-type zwitterionic substance, and water.
Owner:ARKRAY INC
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