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31 results about "Slope error" patented technology

Method for calculating restoring voltage of composite wave-front sensing self-adaptation optical system

ActiveCN105203213AOvercoming Correction Voltage UnderdeterminationPrevent higher order aberrationsOptical measurementsPhotometryWavefront sensorClosed loop
The invention provides a method for calculating the restoring voltage of a composite wave-front sensing self-adaptation optical system. When a high-order wave-front sensor and a wave-front corrector are selected to form a high-order self-adaptation optical system, the restoring voltage V is obtained by multiplying a direct slope wave-front restoring matrix R0 by the wave-front slope s0 measured by the high-order wave-front sensor. When a low-order wave-front sensor and the wave-front corrector are selected to form a low-order self-adaptation optical system, the restoring voltage v is calculated in the following steps that firstly, a wave-front error coefficient a1 is obtained by multiplying a mode reconstruction matrix W1 of the low-order self-adaptation optical system by a wave-front slope error s1 measured by the low-order wave-front sensor; secondly, a corresponding wave-front slope s2 of the high-order wave-front sensor under the aberration of a mode coefficient being a1 is obtained by multiplying a mode response matrix M0 of the high-order self-adaptation optical system by a1; thirdly, the restoring voltage v is obtained by multiplying the direct slope wave-front restoring matrix R0 by the wave-front slope s2. The method can effectively prevent high-order aberration which is generated by the wave-front corrector and cannot be detected by the low-order wave-front sensor, and improves system stability and closed-loop precision.
Owner:INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI

High-precision large-dynamic range measurement system and measurement method for transmission element aberration

The invention provides a high-precision large-dynamic range measurement system and a measurement method for transmission element aberration, which relate to the technical field of measurement. A three-coordinate measuring machine is used for pre-calibrating structural position parameters of the measurement system, a to-be-measured transmission element is placed between a display screen and a CCD camera, a four-step phase-measuring method is adopted to solve phase distribution corresponding to stripes, the actual spot coordinate value of a point on the transmission surface of the to-be-measuredtransmission element corresponding to the phase projected on the CCD camera is obtained, a ray tracing method is then used to generate an ideal coordinate value based on structural position parameters of a detection optical path, slope error calculation is carried out on the to-be-measured transmission element on the basis, and finally, an integral method is used to obtain element aberration data. The technical problems of small dynamic range and expensive equipment for non-contact high-precision transmission element surface detection in the prior art can be solved, a universal feasible method is provided for large-dynamic range transmission element aberration measurement, and an extremely important practical application value is realized.
Owner:CHINA JILIANG UNIV

Heliostat characterization using starlight

The present invention offers an improvement to existing canting, slope error, and / or pointing measurement approaches, by using one or more cameras to observe the reflections of points of light in the firmament, such as the reflections of stars and / or planets as visible within the night sky in the heliostat facets. An illustrative heliostat measurement system comprises a plurality of heliostats, and at least one camera that observes at least one heliostat. The heliostats reflect an image of the firmament that can be observed by the at least one camera. The system further comprises (i) at least one captured image of the firmament reflected from at least one of the heliostats; and (ii) a computer comprising programming that determines a heliostat imperfection from the captured image, wherein the heliostat imperfection is selected from at least one of a slope error, a canting error, and a pointing error.
Owner:SOLARRESERVE TECH

Liquid crystal phased array wave control data determination method based on wave surface iteration

InactiveCN101900900AHigh beam qualityNumber of multiple scan anglesStatic indicating devicesWavefrontRadar
The invention relates to a liquid crystal phased array wave control data determination method based on wave surface iteration, which belongs to the technical field of laser phased array radar and relates to liquid crystal phased array wave beam control. The method mainly comprises the following steps of: (1) calculating an emergency stage wave surface by using a traditional wave control method according to a deflexion angle required to be obtained; (2) calculating an average slope of the stage wave surface and an ideal linear wave surface to obtain an average slope error; (3) recording a step edge position included in the stage wave surface and calculating the change of the average slope of each step edge after translation; and (4) judging whether the change of the average slope after the translation of the step reduces the average slope error or not; and if so, judging whether the step edges are moved leftwards or rightwards and carrying out iteration; and if not, stopping the iteration. By utilizing the relation of the average slope of the emergency stage wave surface of the liquid crystal phased array and the angle error, the invention obtains high-precision wave control data through the translation of the step edges, and can realize wave beam scanning with higher precision and more angles in comparison with the traditional wave control method.
Owner:UNIV OF ELECTRONICS SCI & TECH OF CHINA

Synchrotron radiation curve-edge focus lens design method by combining gravity bending coordinating and maximum application range

InactiveCN102103257AEliminate self-weight surface shape errorsMaximize the scope of application of focusing conditionsMirrorsCondensersLow speedMirror plane
The invention provides a synchrotron radiation curve-edge vertical focus lens design method by combining gravity bending coordinating and the maximum application range. The method comprises the following steps of: establishing a gravity-containing bending deflection differential equation by taking the center of a lens body as an origin and an axis along the length of a lens surface as an x axis according to the beam bending theory of material mechanics; establishing a gravity bending coordinating design equation by making a bending surface have an oval shape; when a focusing condition deviation design value is calculated, adjusting a focus lens bending moment deviation design value to adapt to the variation of the focusing condition; establishing the maximum application range design equation by making residual surface shape slope error after the bending moment is adjusted increase at the lowest speed along with the focusing condition; and solving the bending mechanics and lens body geometric design parameter kMfd and W(x) functions by combining the gravity bending coordinating design equation and the maximum application range design equation. By the method, self-gravity surface shape error can be eliminated and the application range of the focusing condition is maximized.
Owner:INST OF HIGH ENERGY PHYSICS CHINESE ACADEMY OF SCI

Method for quickly and quantitatively measuring content of tetrapropylammonium bromide in zeolite synthesis waste liquid

The invention discloses a method for quickly and quantitatively measuring the content of tetrapropylammonium bromide in zeolite synthesis waste liquid, which comprises the steps of drawing a linear curve A of the molar concentration of pure tetrapropylammonium bromide and linear curves (B1,..., Bn) of the molar concentration of tetrapropylammonium bromide in the waste liquid under different dilution ratios; performing linear regression on (B1,..., Bn) to obtain a linear curve C of which the slope error from A is not over +/-0.02%, wherein the linear curve C is used for quickly and quantitatively measuring the molar concentration of tetrapropylammonium bromide in the waste liquid; calculating the content of tetrapropylammonium bromide in the waste liquid. The method disclosed by the invention has the advantages that by establishing a linear curve A of the molar concentration of pure tetrapropylammonium bromide, adding the known amount of tetrapropylammonium bromide into the waste liquid to be measured and then performing regression correction on the measurement result, the influence on the titration effect caused by the impurities in the waste liquid is eliminated, the accurate content of tetrapropylammonium bromide in the waste liquid is obtained, the analysis precision can exceed 95%, the repeatability is high, and quick and quantitative measurement of the content of tetrapropylammonium bromide in the waste liquid is realized so that the waste liquid can be recycled.
Owner:JIANGSU TIANNUO NEW MATERIAL TECH

Rapid Quantitative Determination of Tetrapropylammonium Bromide in Zeolite Synthesis Waste Liquid

The invention discloses a method for quickly and quantitatively measuring the content of tetrapropylammonium bromide in zeolite synthesis waste liquid, which comprises the steps of drawing a linear curve A of the molar concentration of pure tetrapropylammonium bromide and linear curves (B1,..., Bn) of the molar concentration of tetrapropylammonium bromide in the waste liquid under different dilution ratios; performing linear regression on (B1,..., Bn) to obtain a linear curve C of which the slope error from A is not over + / -0.02%, wherein the linear curve C is used for quickly and quantitatively measuring the molar concentration of tetrapropylammonium bromide in the waste liquid; calculating the content of tetrapropylammonium bromide in the waste liquid. The method disclosed by the invention has the advantages that by establishing a linear curve A of the molar concentration of pure tetrapropylammonium bromide, adding the known amount of tetrapropylammonium bromide into the waste liquid to be measured and then performing regression correction on the measurement result, the influence on the titration effect caused by the impurities in the waste liquid is eliminated, the accurate content of tetrapropylammonium bromide in the waste liquid is obtained, the analysis precision can exceed 95%, the repeatability is high, and quick and quantitative measurement of the content of tetrapropylammonium bromide in the waste liquid is realized so that the waste liquid can be recycled.
Owner:JIANGSU TIANNUO NEW MATERIAL TECH

Method and device for detecting surface shape of planar component through adopting slope splicing

The present invention provides a method for detecting the surface shape of a planar component through adopting slope splicing. When the method is used for detecting the planar component, involved basic components include pinhole cameras, a display, and a component under test. In a case where the measurement area of one pinhole camera cannot cover the entire component under test, in order to avoidmoving a measurement device or the component under test during measurement, save measurement time and realize high-precision measurement, a plurality of pinhole cameras can be used to simultaneously measure different areas of the component under test, wherein adjacent areas have overlapping regions; after slope data measured by the pinhole cameras are obtained, a slope splicing method provided bythe present invention can be used to completely correct slope error in the overlapping regions which is caused by the difference of the calibration and adjustment of different cameras; and the complete slope of the component under the test can be obtained. The method and device of the invention have the advantages of high measurement precision and high measurement speed. With the method and deviceof the invention adopted, measurement can be completed at one time, and a working distance can be decreased.
Owner:SICHUAN UNIV

Synchrotron radiation curve-edge focus lens design method by combining gravity bending coordinating and maximum application range

InactiveCN102103257BEliminate self-weight surface shape errorsMaximize the scope of application of focusing conditionsMirrorsCondensersLow speedEllipse
The invention provides a method for obtaining gravity-assisting bending combined maximum application range of a synchrotron radiation curve-edge vertical focus lens, including: establishing a gravity-containing bending deflection differential equation by taking the center of a lens body as an origin and an axis along the length of a lens surface as an x axis according to the beam bending theory of material mechanics; establishing a gravity-assisting bending equation by enabling a bending surface to be an oval shape; when a focusing condition is calculated to deviate a calculation value, adjusting a focus lens bending moment deviation value to adapt to the variation of the focusing condition; establishing the maximum application range design equation by enabling residual surface shape slope error after the bending moment is adjusted to increase at the lowest speed along with the focusing condition; solving the bending mechanics and lens body geometric parameter kMfd and W(x) functions by combining the gravity-assisting bending equation and the maximum application range equation; and determining the focus lens parameter according to the calculation result and bending the focus lens. By the method, self-gravity surface shape error can be eliminated and the application range of the focusing condition is maximized.
Owner:INST OF HIGH ENERGY PHYSICS CHINESE ACAD OF SCI

Liquid crystal phased array wave control data determination method based on wave surface iteration

InactiveCN101900900BHigh beam qualityNumber of multiple scan anglesStatic indicating devicesWavefrontRadar
The invention relates to a liquid crystal phased array wave control data determination method based on wave surface iteration, which belongs to the technical field of laser phased array radar and relates to liquid crystal phased array wave beam control. The method mainly comprises the following steps of: (1) calculating an emergency stage wave surface by using a traditional wave control method according to a deflexion angle required to be obtained; (2) calculating an average slope of the stage wave surface and an ideal linear wave surface to obtain an average slope error; (3) recording a stepedge position included in the stage wave surface and calculating the change of the average slope of each step edge after translation; and (4) judging whether the change of the average slope after thetranslation of the step reduces the average slope error or not; and if so, judging whether the step edges are moved leftwards or rightwards and carrying out iteration; and if not, stopping the iteration. By utilizing the relation of the average slope of the emergency stage wave surface of the liquid crystal phased array and the angle error, the invention obtains high-precision wave control data through the translation of the step edges, and can realize wave beam scanning with higher precision and more angles in comparison with the traditional wave control method.
Owner:UNIV OF ELECTRONICS SCI & TECH OF CHINA

A method for calculating the recovery voltage of complex wavefront sensing adaptive optics system

ActiveCN105203213BOvercoming Correction Voltage UnderdeterminationPrevent higher order aberrationsOptical measurementsPhotometryWavefront sensorClosed loop
The present invention provides a method for calculating the recovery voltage of a composite wavefront sensing adaptive optical system. When a high-order wavefront sensor and a wavefront corrector are selected to form a high-order adaptive optical system, the direct slope wavefront restoration matrix R0 is used to multiply the high-order wavefront The wavefront slope s0 measured by the front sensor is used to obtain the restored voltage v; when a low-order wavefront sensor and a wavefront corrector are selected to form a low-order adaptive optics system, the calculation of the restored voltage v has the following steps: (1) Using the low-order self-adaptive optics system The mode reconstruction matrix W1 of the adaptive optics system is multiplied by the wavefront slope error s1 measured by the low-order wavefront sensor to obtain the wavefront error coefficient a1; (2) the mode response matrix M0 of the high-order adaptive optics system is multiplied by a1 to obtain The corresponding wavefront slope s2 of the high-order wavefront sensor under the aberration of the mode coefficient a1; (3) The restored voltage v is obtained by multiplying the wavefront slope s2 by the direct slope wavefront restoration matrix R0. The invention can effectively prevent the wavefront corrector from producing high-order aberrations that cannot be detected by low-order wavefront sensors, and improve the stability and closed-loop accuracy of the system.
Owner:INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
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