60results about How to "Avoid false conclusions" patented technology

The invention relates to an identification method for distinguishing iron ore from oxide scale, which is used for identifying the attributes of the iron ore and the oxide scale by analyzing and comparing characteristic spectrum peaks of hematite, magnetite, ferrous oxide and pure iron by respectively adopting X-ray diffraction spectroscopy and scanning electron microscopy through X-ray diffraction spectrums and judging whether the hematite, magnetite, the ferrous oxide and the pure iron have obvious characteristics of oxide scale under an electron microscope. The identification method prevents import goods from passing through the Custom under another name in terms of the source, provides technical support for inspection and quarantine and for the Custom, provides scientific authentication reports for traders, guarantees border security, and avoids pollution to environment. The identification method discloses and establishes an identification process for the first time, standardizes the working method for identification, and is instructive for identifying the raw materials of all the imported wastes.

The invention discloses a simulation method and device for chip surface morphology, which are used for solving the problem that errors are bigger during simulation of GW model chip surface morphology. The method comprises the steps as follows: determining effective feature roughness parameter of a polishing pad relevant to a chip connecting linewidth; determining modified index distribution of a polishing pad rough peak according to the effective feature roughness parameter; establishing a first relation between the surface contact pressure of the polishing pad and the chip and polishing pad deformation according to the index distribution and the Hertz elastic theory; establishing a second relation between the polishing pad and the chip surface contact pressure and the polishing pad deformation according to a contact mechanics equation; calculating the relation between the polishing pad and the chip surface contact pressure and the polishing pad deformation according to the first relation and the second relation; and performing chip surface morphology simulation by using the relation of contact pressure and the deformation of the chip. The technical scheme provided by the invention avoids the wrong solution of the GW model in small linewidth CMP (chemical mechanical planarization) processing simulation, and improves the simulation and prediction accuracy of the GW model.

The invention provides a method, device and electronic equipment for determining the relationship between a point and a fence, and relates to the technical field of data processing. Wherein, the method includes: determining the target grid where the target point is located; determining the fence containing the target grid in the index grid as the target fence; wherein, the fence object of the target fence includes a partial fence, and the local fence is the boundary grid of the target fence and the target fence ; determine whether the boundary grid of the target fence contains the target grid; if so, determine the positional relationship between the target point and the target fence according to the positional relationship between the target point and the local fence. The invention can improve the determination efficiency of the positional relationship between the point and the fence, and more accurately determine the relationship between the point and the fence.