Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Sulfuric acid etching process method

A process method, sulfuric acid technology, applied in the direction of sustainable manufacturing/processing, electrical components, climate sustainability, etc., to achieve the effect of increasing corrosion uniformity, increasing the concentration of chemical solution, and increasing the concentration of hydrogen ions

Inactive Publication Date: 2021-02-09
平煤隆基新能源科技有限公司
View PDF0 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] At present, major battery manufacturers in the world are accelerating the production scale and research and development of monocrystalline cells. The efficiency of monocrystalline cells is facing pressure to improve and urgent breakthroughs, and the method of adding sulfuric acid initial preparation and liquid replenishment by etching is used to optimize the backside polishing effect and improve the backside. It is very direct and simple to improve the conversion efficiency of the battery under the challenge of technological innovation and large-scale production, and it is a relatively economical and feasible method under the premise of stable production indicators.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Sulfuric acid etching process method
  • Sulfuric acid etching process method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0043]Example: Using the process of the invention

[0044]After using 166mm×166mm P-type monocrystalline silicon wafers with a resistivity of 0.4~1.1Ω•cm for texturing, diffusion and SE doping, the wafers are automatically fed to the etching and feeding area. The wafer spacing and speed The etched groove roller and structure, and other groove structures and processes are unchanged.

[0045]The temperature of the etching tank of the etching machine is set to 12℃, the circulating flow rate is set to 40 L / min, the amount of water film is set to 20ml, the initial dosage: the initial dosage of pure water is set to 225g / L, the initial dosage of hydrofluoric acid Set 92.5g / L, the initial dosage of nitric acid to 483.5g / L, and the initial dosage of sulfuric acid to 226g / L; replenishment volume: water replenishment volume is set to 0mL / tablet, hydrofluoric acid replenishment volume is set to 3.78mL / tablet, nitric acid The amount of fluid replacement was set to 4.11 mL / tablet, and the amount of sul...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a sulfuric acid etching process method, which comprises the following steps of: in an etching process of a silicon wafer, setting the initial proportioning amount of pure waterin an etching tank to be 220+ / -50g / L, the initial proportioning amount of hydrofluoric acid to be 100+ / -50g / L, the initial proportioning amount of nitric acid to be 510+ / -50g / L and the initial proportioning amount of sulfuric acid to be 220+ / -50g / L; the pure water supplementing amount of the etching tank is set to be 0 mL / piece, the hydrofluoric acid supplementing amount is set to be 4.0+ / -2.0 mL / piece, the nitric acid supplementing amount is set to be 5.0+ / -2.0 mL / piece, and the sulfuric acid supplementing amount is set to be 1.5+ / -1.0 mL / piece; and according to the method, equipment (suitable for rollers of different types or tooth depths) does not need to be improved, sulfuric acid only needs to be supplemented in the primary preparation and production process of the etching groove, polishing of the back face of the silicon wafer and improvement of the reflectivity can be achieved through comprehensive optimization and adjustment of the process temperature, the circulating flow andthe water film amount, then the purpose of improving the conversion efficiency of the single crystal cell is achieved, and various electrical parameters of the prepared silicon wafer completely meetthe original requirements, and the process is simple and easy to implement.

Description

Technical field[0001]The invention belongs to the technical field of crystalline silicon solar cell manufacturing, and specifically relates to a process method for etching sulfuric acid.Background technique[0002]Single crystal etching and polishing use the combined effect of hydrofluoric acid and nitric acid, that is, isotropic corrosion. The corrosion process is to produce nitrous acid from the contact between undissociated nitric acid and silicon, and the reaction rate is determined by nitrous acid. The production of nitrous acid in this reaction is an autocatalytic process. The nitrous acid in the solution reacts with nitric acid to form nitrous acid again. The higher the nitrous acid content in the solution, the faster the rate of nitrous acid formation. The nitrous acid and some + The trivalent nitrogen active material oxidizes the contact surface of the silicon wafer to form silicon dioxide. The silicon dioxide on the contact surface of the silicon wafer reacts with hydrofluor...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L31/18H01L21/306
CPCH01L21/30604H01L31/1876Y02P70/50
Inventor 高继龙彭平夏中高李旭杰
Owner 平煤隆基新能源科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products