Preparation method for SiGe-based heterogeneous SPiN diode applied to reconfigurable annular antenna
A loop antenna and diode technology, applied in the direction of antenna, radiation element structure, antenna grounding switch structure connection, etc., can solve the problems of large injection dose and energy, impact concentration, incompatibility, etc., to suppress the impact and improve the breakdown voltage Effect
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Embodiment 1
[0060] An embodiment of the present invention provides a method for preparing a SiGe-based heterogeneous SPiN diode for a reconfigurable loop antenna, and the SiGe-based heterogeneous SPiN diode is used to manufacture a reconfigurable loop antenna. Please refer to figure 1 , figure 1 It is a structural schematic diagram of a reconfigurable loop antenna according to an embodiment of the present invention; the loop antenna includes: a semiconductor substrate (1); a dielectric plate (2); a first SPIN diode ring (3), a second SPIN diode ring (4), the first DC bias line (5) and the second DC bias line (6) are all arranged on the semiconductor substrate (1); the coupled feed source (7) is arranged on the On the dielectric plate (2); the first SPIN diode ring (3), the second SPIN diode ring (4), the first DC bias line (5) and the second DC bias line (6) Manufactured on the semiconductor substrate (1) using a semiconductor process.
[0061] Please refer to figure 2 , figure 2 I...
Embodiment 2
[0102] See Figure 7a-Figure 7r , Figure 7a-Figure 7r It is a schematic diagram of a method for preparing a heterogeneous SiGe-based plasma SPIN diode according to an embodiment of the present invention. On the basis of the first embodiment above, to prepare a solid-state plasma SPIN diode with a channel length of 22nm (the length of the solid-state plasma region is 100 microns) As an example to describe in detail, the specific steps are as follows:
[0103] Step 1, substrate material preparation steps:
[0104] (1a) if Figure 7a As shown, the SiGeOI substrate 101 with (100) crystal orientation is selected, the doping type is p-type, and the doping concentration is 1014cm -3 , the thickness of the top layer SiGe is 50 μm;
[0105] (1b) if Figure 7b As shown, the method of chemical vapor deposition (Chemical vapor deposition, referred to as CVD) is used to deposit a layer of first SiO with a thickness of 40 nm on the SiGe layer. 2 layer 201;
[0106] (1c) Deposit a la...
Embodiment 3
[0133] Please refer to Figure 8 , Figure 8 It is a schematic diagram of a device structure of a heterogeneous SiGe-based plasmonic SPIN diode according to an embodiment of the present invention. The heterogeneous SiGe-based plasmonic SPIN diode employs the above-mentioned as figure 2 The preparation method shown is made, specifically, the SiGe-based plasma SPIN diode is prepared and formed on the SiGeOI substrate 301, and the P region 304, the N region 305 of the SPIN diode and the lateral direction are located between the P region 304 and the N region 305 The I-regions between them are located in the top layer SiGe302 of the substrate. Wherein, the SPIN diode can be isolated by STI deep trenches, that is, an isolation trench 303 is provided outside the P region 304 and the N region 305, and the depth of the isolation trench 303 is greater than or equal to the thickness of the top SiGe layer.
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