A method for preparing copper thin film by controlled atmosphere cold spraying
A technology of copper film and cold spraying, applied in the direction of pressure inorganic powder plating, etc., can solve the problems of serious sewage pollution of electrolytic copper foil, large production water consumption, high scrap rate, etc., achieve uniform and controllable film thickness, prevent metal oxidation, The effect of simple and flexible process
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Embodiment 1
[0044] In this embodiment, spherical submicron pure copper powder is selected as the raw material, the particle size of the original copper powder particles is in the range of 0.3-1.5 μm, the polished monocrystalline silicon wafer is used as the substrate, and helium is used as the carrier gas. The gas pressure during spraying is 0.1MPa, gas preheating temperature is 200℃, spraying distance is 5mm, using controlled atmosphere cold spraying to prepare copper thin film on monocrystalline silicon wafer, the thickness of the thin film is about 10μm, Figure 4 It is the SEM photo of the cross-section of the copper film. From the morphology of the prepared copper film, it can be seen that the copper film is uniform and continuous, and it is well combined with the substrate without cracks.
Embodiment 2
[0046] In this embodiment, spherical submicron pure copper powder is selected as the raw material, the particle size of the original copper powder particles is in the range of 0.3-1.5 μm, the polished monocrystalline silicon wafer is used as the substrate, and helium is used as the carrier gas. The gas pressure during spraying is 0.1MPa, a gas preheating temperature of 100°C, a spraying distance of 5mm, and a controlled atmosphere cold spraying to prepare a copper film on a monocrystalline silicon wafer with a thickness of about 7μm.
Embodiment 3
[0048] In this embodiment, spherical submicron pure copper powder is selected as the raw material, the particle size of the original copper powder particles is in the range of 0.3-1.5 μm, the polished monocrystalline silicon wafer is used as the substrate, and helium is used as the carrier gas. The gas pressure during spraying is 0.1MPa, gas preheating temperature is 200℃, spraying distance is 10mm, using controlled atmosphere cold spraying to prepare copper film pattern on monocrystalline silicon wafer, pattern single line width is 0.14±0.02mm, thickness is about 4μm, Figure 5 It is a photo of the copper film pattern. From the overall appearance of the prepared copper pattern, it can be seen that the copper pattern line is uniform and continuous, and various required two-dimensional copper film patterns can be prepared according to requirements.
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