Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Stair-type self-adaptive air sealing device used for immersed type photoetching machine

A technology of gas sealing and sealing devices, which is applied in the direction of photolithography exposure devices, microlithography exposure equipment, etc., can solve problems such as unstable pressure and flow, affecting exposure quality, and not fully considering serious consequences, so as to ensure stability , Improve the effect of stability and reliability

Active Publication Date: 2013-01-16
ZHEJIANG CHEER TECH CO LTD
View PDF9 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The larger the advancing contact angle, the easier it is for the outside gas to be entrained into the flow field to form bubbles, thereby affecting the uniformity of the flow field and the exposure imaging quality; the smaller the receding contact angle, the easier it is for the boundary liquid to be pulled to the periphery of the flow field. Leakage of liquid, and thus the formation of a series of defects (eg: water stains)
[0007] (2) The commonly used pressure-equalizing air seal method cannot adaptively compensate the boundary of the flow field, because a smaller air seal pressure will make it easier to leak at the receding contact angle, and a larger air seal pressure Will increase the possibility of liquid bubble entrainment at the advancing contact angle, the optimal seal gas pressure distribution changes instantaneously with the high-speed dynamic changes of the flow field boundary
However, there are also some sealing patents (for example, Chinese patents ZL200810164176.5 and ZL200910096971.X) that use non-uniform pressure air sealing or rotating to perform adaptive sealing of the gap flow field. Although the sealing effect is improved, there are still some shortcomings : During the high-speed and complex movement of the substrate, the slit flow field is in a turbulent state
As a result, the pressure and flow are unstable, and the pressure fluctuations caused by not being released effectively in time will continue to superimpose and cause vibration problems to the device, which will affect the exposure quality; in addition, these methods do not fully consider the extreme harshness of the substrate. Auxiliary remedial measures for serious consequences (such as droplet leakage) brought about by working conditions (such as instantaneous high acceleration and emergency stop conditions)

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Stair-type self-adaptive air sealing device used for immersed type photoetching machine
  • Stair-type self-adaptive air sealing device used for immersed type photoetching machine
  • Stair-type self-adaptive air sealing device used for immersed type photoetching machine

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0031] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0032] Such as figure 1 , figure 2 , image 3 , Figure 4 , Figure 5 As shown, the present invention includes a projection lens group 1 , a sealing device and a substrate 3 , and the sealing device is arranged between the projection lens group 1 and the substrate 3 . The sealing device is a stepped adaptive gas sealing device 2, including a lower component 2A, an upper component 2B and a rotating component 2C; wherein:

[0033] 1) Lower member 2A: The lower member 2A is an annular cylinder, and there are 10-18 fan-shaped multi-layer air-tight channels 4A equidistant in the circumferential direction, and each air-tight channel has 5-8 layers; the lower part of the air-tight channel There is an inclined air-tight chamber 5A that expands from the inside to the outside; return air passages 6A are equidistantly distributed around the air-tight passage...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a stair-type self-adaptive air sealing device used for an immersed type photoetching machine. The air sealing device is a device arranged between a projection lens group and a lining and is composed of an upper component, a lower component and a rotary component; in the photoetching scanning process, the boundary state of an immersed flow field can be changed rapidly along with the traction function of the high speed movement of the lining to the immersing liquid. The interior of the device adopts a multi-layer stair-type air sealing structure, the air sealing pressure is increased gradually from the center to outside, and the sealing pressure of air in each layer is adjusted in real time according to the movement direction and the speed of the lining, so that the leakage of the immersing liquid caused by insufficient periphery sealing pressure and the bubble entrainment caused by overhigh internal air sealing pressure are prevented, and thereby the self-adaptive air sealing of the liquid is realized; and meanwhile, by adopting spiral air flow auxiliary sealing outside the device, the reliability and the stability of the air sealing are further improved.

Description

technical field [0001] The invention relates to a sealing device for an immersion photolithography machine, in particular to a stepped self-adaptive gas sealing device for an immersion photolithography machine. Background technique [0002] Modern lithography equipment is based on optical lithography, which uses an optical system to accurately project and expose the pattern on the mask onto a substrate (such as a silicon wafer) coated with photoresist. It includes an ultraviolet light source, an optical system, a projection mask composed of chip patterns, an alignment system and a substrate covered with photosensitive photoresist. [0003] The immersion lithography (Immersion Lithography) system fills a certain liquid in the gap between the projection lens and the substrate, and increases the numerical aperture (NA) of the projection lens by increasing the refractive index (n) of the medium in the gap, thereby improving Photolithographic resolution and depth of focus. [0...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G03F7/20
Inventor 傅新刘琦陈文昱
Owner ZHEJIANG CHEER TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products