Additive for acidic texturing liquid of polycrystalline silicon wafers and application thereof

A technology of polycrystalline silicon wafers and additives, which is applied in the field of acid texturing and additives for acid texturing of polycrystalline silicon wafers. It can solve the problems of reducing the surface reflectivity of silicon wafers, reducing reflectivity, dark lines of silicon wafers, etc., and achieve good practical application value. Easy to formulate and use

Active Publication Date: 2014-04-09
BEIJING HEDEFENG MATERIAL TECH
View PDF7 Cites 17 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The patent is in HF-HNO 3 Add H to the system 2 SO 4 or H 3 PO 4 , through H 2 SO 4 or H 3 PO 4 Catalysis and buffering effect to control the reaction rate, thereby reducing the surface reflectivity of the silicon wafer after texturing, but this patent needs to add a large amount of H 2 SO 4 or H 3 PO 4 To achieve the goal of reducing the reflectivity, the cost of texturing is relatively high, and the patented texturing system is an HF-rich system. After texturing, dark lines formed by deep corrosion pits are prone to appear on the surface of silicon wafers, which will affect the photoelectric conversion of solar cells. Efficiency adversely affected

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Additive for acidic texturing liquid of polycrystalline silicon wafers and application thereof
  • Additive for acidic texturing liquid of polycrystalline silicon wafers and application thereof
  • Additive for acidic texturing liquid of polycrystalline silicon wafers and application thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0031] An additive for acidic texturing liquid for polycrystalline silicon wafers, comprising the following components: pentaerythritol, anhydrous sodium acetate, polyethylene glycol and deionized water.

[0032] Wherein, the weight percentage of the pentaerythritol is 0.5%, the weight percentage of the anhydrous sodium acetate is 0.5%, the weight percentage of the polyethylene glycol is 0.5%, and the balance is deionized water.

[0033] The polyethylene glycol is polyethylene glycol with a molecular weight of 200.

[0034] A method for acid texturing using the above-mentioned additives, comprising the following steps:

[0035] 1) Prepare additives: dissolve pentaerythritol, anhydrous sodium acetate and polyethylene glycol in deionized water to prepare additives;

[0036] 2) Preparation of acidic texturing solution: dissolving hydrofluoric acid and nitric acid in deionized water to prepare an acid mixed solution, and then adding the additives prepared in step 1) to the acid m...

Embodiment 2

[0040] An additive for acidic texturing liquid for polycrystalline silicon wafers, comprising the following components: pentaerythritol, anhydrous sodium acetate, polyethylene glycol and deionized water.

[0041] Wherein, the weight percentage of the pentaerythritol is 2%, the weight percentage of the anhydrous sodium acetate is 2%, the weight percentage of the polyethylene glycol is 2%, and the balance is deionized water.

[0042] The polyethylene glycol is polyethylene glycol with a molecular weight of 400.

[0043] A method for acid texturing using the above-mentioned additives, comprising the following steps:

[0044] 1) Prepare additives: dissolve pentaerythritol, anhydrous sodium acetate and polyethylene glycol in deionized water to prepare additives;

[0045] 2) Preparation of acidic texturing solution: dissolving hydrofluoric acid and nitric acid in deionized water to prepare an acid mixed solution, and then adding the additives prepared in step 1) to the acid mixed s...

Embodiment 3

[0049] An additive for acidic texturing liquid for polycrystalline silicon wafers, comprising the following components: pentaerythritol, anhydrous sodium acetate, polyethylene glycol and deionized water.

[0050] Wherein, the weight percentage of the pentaerythritol is 1%, the weight percentage of the anhydrous sodium acetate is 1%, the weight percentage of the polyethylene glycol is 1%, and the balance is deionized water.

[0051] The polyethylene glycol is polyethylene glycol with a molecular weight of 1000.

[0052] A method for acid texturing using the above-mentioned additives, comprising the following steps:

[0053] 1) Prepare additives: dissolve pentaerythritol, anhydrous sodium acetate and polyethylene glycol in deionized water to prepare additives;

[0054] 2) Preparation of acidic texturing solution: dissolving hydrofluoric acid and nitric acid in deionized water to prepare an acid mixed solution, and then adding the additives prepared in step 1) to the acid mixed ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
reflectanceaaaaaaaaaa
reflectanceaaaaaaaaaa
reflectanceaaaaaaaaaa
Login to view more

Abstract

The invention relates to an additive for acidic texturing liquid of polycrystalline silicon wafers and an application thereof. The additive comprises the following components: pentaerythritol, anhydrous sodium acetate, polyethylene glycol and deionized water. An acidic texturing method using the additive comprises the following steps: 1) dissolving pentaerythritol, anhydrous sodium acetate and polyethylene glycol in deionized water to prepare the additive; 2) dissolving hydrofluoric acid and nitric acid in deionized water to prepare a mixed acid solution, and then, adding the additive into the mixed acid solution to obtain acidic texturing liquid; 3) soaking a mortar cut polycrystalline silicon wafer or a diamond wire cut polycrystalline silicon wafer in the acidic texturing liquid for texturing. By adopting the additive provided by the invention, after the texturing operation, the reflectivity of the diamond wire cut polycrystalline silicon wafer is about 6% less than the reflectivity of the diamond wire cut polycrystalline silicon wafer in a conventional texturing process, and the reflectivity of the mortar cut polycrystalline silicon wafer is about 3-5% less than the reflectivity of the mortar cut polycrystalline silicon wafer in the conventional texturing process.

Description

technical field [0001] The invention relates to an additive for acidic texturing liquid of polycrystalline silicon wafers and its application, in particular to an additive for acidic texturing of polycrystalline silicon wafers which can be simultaneously applied to mortar cutting and diamond wire cutting, and a method for acid texturing using the additive. Background technique [0002] At present, the cutting of crystalline silicon wafers used in the photovoltaic field mainly adopts the mortar multi-wire cutting technology, but this technology has problems such as low cutting process efficiency, high cutting processing costs, and large discharge pollution of waste mortar after cutting. In contrast, solid abrasive diamond wire saw cutting (abbreviated as diamond wire cutting) technology has received more and more attention due to its advantages of high cutting efficiency, low cutting processing cost and clean environment, and is expected to become Future directions of materia...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): C23F1/24C30B33/10B28D5/04
Inventor 李春贤
Owner BEIJING HEDEFENG MATERIAL TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products