Wet process chemical preparation method for black silicon with pointed-cone-shaped surface
A wet chemistry, black silicon technology, applied in final product manufacturing, sustainable manufacturing/processing, semiconductor/solid-state device manufacturing, etc., can solve the problem of uneven distribution of nanowire structures, actual production cost requirements, low current collection efficiency, etc. problem, to achieve the effect of good repeated use, controllable morphology, and small residual stress
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Embodiment 1
[0037](1) Prepare the first etching solution, that is, 100 mL of a mixed solution of copper nitrate, hydrofluoric acid and hydrogen peroxide, in which the concentration of copper nitrate is 46.5 mmol / L, the volume fraction of hydrofluoric acid is 8%, and the peroxide The volume fraction of hydrogen is 38%, and the solvent is deionized water. Put the monocrystalline silicon sample after the RCA cleaning process into the first etching solution at 55°C, take out the silicon wafer after 60 minutes, wash the surface with a large amount of deionized water, and dry it to obtain the initially etched monocrystalline silicon sample . After characterization tests, it can be obtained as image 3 In the top view of the SEM shown, due to a layer of residue on the surface, the macroscopic appearance is brownish yellow.
[0038] (2) Prepare the second etching solution, that is, 50 mL of a mixed solution of copper nitrate, hydrogen peroxide and ammonium bifluoride, in which the concentration...
Embodiment 2
[0040] (1) Prepare the first etching solution, that is, 100 mL of a mixed solution of copper nitrate, hydrofluoric acid and hydrogen peroxide, in which the concentration of copper nitrate is 49.6 mmol / L, the volume fraction of hydrofluoric acid is 10%, and the peroxide The volume fraction of hydrogen is 36%, and the solvent is deionized water. Put the single crystal silicon sample after the RCA cleaning process into the first etching solution at 50°C, take out the silicon wafer after 50 minutes, wash the surface with a large amount of deionized water, and dry it to obtain the initial etched single crystal silicon sample . After characterization tests, it can be obtained as Figure 4 In the top view of the SEM shown, since there is also a layer of residue on the surface, the macroscopic appearance is brownish yellow; the surface of the black silicon forms a relatively uniform tetragonal porous layer with a pore size of about 2um.
[0041] (2) Prepare the second etching soluti...
Embodiment 3
[0043] (1) Prepare the first etching solution, that is, 100 mL of a mixed solution of copper nitrate, hydrofluoric acid and hydrogen peroxide, in which the concentration of copper nitrate is 51.2 mmol / L, the volume fraction of hydrofluoric acid is 8%, and the peroxide The volume fraction of hydrogen is 36%, and the solvent is deionized water. Put the monocrystalline silicon sample after the RCA cleaning process into the first etching solution at 45°C, take out the silicon wafer after 50 minutes, wash the surface with a large amount of deionized water, and dry it to obtain the initially etched monocrystalline silicon sample . There is also a layer of residue on the surface, which is brownish-yellow macroscopically.
[0044] (2) Prepare the second etching solution, that is, 50 mL of a mixed solution of copper nitrate, hydrogen peroxide and ammonium bifluoride, in which the concentration of copper nitrate is 28.4 mmol / L, the volume fraction of hydrogen peroxide is 28%, and the c...
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