193 results about "Optical computing" patented technology

A method of selecting components for a multivariate optical computing and analysis system to isolate a spectral region includes selecting a spectral region of interest; selecting a spectral element with a predetermined transmission characteristic to control a spectral range of an illumination source; illuminating a sample with the illumination source; and analyzing an optical frequency returned by the sample relative to the spectral region of interest.

Multivariate optical analysis systems employ multivariate optical elements and utilize multivariate optical computing methods to determine information about a product carried by light reflected from or transmitted through the product. One method of processing and monitoring the product includes introducing the product at an inspection point; illuminating the product with a spectral-specific light though an optic lens; directing the light that has passed through at least a section of the product through at least one multivariate optical element to produce a first signal, the directed light carrying information about the product; detecting the first signal at a first detector; deflecting a portion of the directed light to produce a second signal in a direction of a second detector, the second detector configured to detect the second signal; and determining at least one property of the product at a rate of about one section of the product per second to about five sections of the product per second based upon the detector outputs.

A multivariate optical computing and analysis system includes a light source configured to radiate a first light along a first ray path; a modulator disposed in the first ray path, the modulator configured to modulate the first light to a desired frequency; a spectral element disposed proximate the modulator, the spectral element configured to filter the first light for a spectral range of interest of a sample; a cavity disposed in communication with the spectral element, the cavity configured to direct the first light in a direction of the sample; a tube disposed proximate the cavity, the tube configured to receive and direct a second light generated by a reflection of the first light from the sample, the tube being further configured to separate the first and second lights; a beamsplitter configured to split the second light into a first beam and a second beam; an optical filter mechanism disposed to receive the first beam, the optical filter mechanism configured to optically filter data carried by the first beam into at least one orthogonal component of the first beam; and a detector mechanism in communication with the optical filter mechanism to measure a property of the orthogonal component to measure the data.

A method of arranging and utilizing a multivariate optical computing and analysis system includes transmitting a o first light from a light source; generating a second light by reflecting the first light from the sample; directing a portion of the second light with a beamsplitter; and arranging an optical filter mechanism in a normal incidence orientation to receive the portion of the second light, the optical filter mechanism being configured to optically filter data carried by the portion of the second light.

The present subject matter relates to methods of high-speed analysis of product samples. Light is directed to a portion of a product under analysis and reflected from or transmitted through the product toward an optical detector. Signals for the detector are compared with reference signals based on a portion of the illuminating light passing through a reference element to determine characteristics of the product under analysis. Temperature within the analysis system is monitored and the output signals of the optical detectors are compensated or corrections are made within the analysis calculations to compensate or correct for the system temperature. The products under analysis may be stationary, moved by an inspection point by conveyor or other means, or may be contained within a container, the container including a window portion through which the product illuminating light may pass.

Optical computing devices are disclosed. One exemplary optical computing device includes an electromagnetic radiation source configured to optically interact with a sample and at least two integrated computational elements. The at least two integrated computational elements are configured to produce optically interacted light and further configured to be associated with a characteristic of the sample. The optical computing device further includes a first detector arranged to receive the optically interacted light from the at least two integrated computational elements and thereby generate a first signal corresponding to the characteristic of the sample.

The present subject matter relates to methods of high-speed analysis of product samples. Light is directed to a portion of a product under analysis and reflected from or transmitted through the product toward a plurality of optical detectors. Signals from the detectors are compared with a reference signal based on a portion of the illuminating light passing through a reference element to determine characteristics of the product under analysis. The products under analysis may be stationary, moved by an inspection point by conveyor or other means, or may be contained within a container, the container including a window portion through which the product illuminating light may pass.

Optical computing devices are disclosed. One exemplary optical computing device includes an electromagnetic radiation source configured to optically interact with a sample and at least two integrated computational elements. The at least two integrated computational elements may be configured to produce optically interacted light, and at least one of the at least two integrated computational elements may be configured to be disassociated with a characteristic of the sample. The optical computing device further includes a first detector arranged to receive the optically interacted light from the at least two integrated computational elements and thereby generate a first signal corresponding to the characteristic of the sample.

An optical analysis system includes a light source configured to radiate a first light along a first ray path; a modulator disposed in the first ray path, the modulator configured to modulate the first light to a desired frequency; a spectral element disposed proximate the modulator, the spectral element configured to filter the first light for a spectral range of interest of a sample; a cavity in communication with the spectral element, the cavity configured to direct the first light in a direction of the sample; a conical mirror configured to convert the first light reflecting from the sample into a second light, the cavity being further configured to direct the second light; a beamsplitter configured to split the second light into a first beam and a second beam; an optical filter mechanism disposed to receive the first beam, the optical filter mechanism configured to optically filter data carried by the first beam into at least one orthogonal component of the first beam; a first detector mechanism in communication with the optical filter mechanism to measure a property of the orthogonal component to measure the data; a second detector mechanism configured to receive the second beam for comparison of the property of the orthogonal component to the second beam; an accelerometer configured to control the data acquisition such that only detector signals during the period of time when the system is in the proper orientation such that the material sample (e.g., aspirin) is in proximity to the interrogation window are used for calculation; a computer having a data acquisition and conversion card, the computer disposed in the system in communication with the first and second detector mechanisms for signal processing; and a battery and charging system disposed in the system in electrical communication with the system to provide stand-alone operation capability.

Optical computing devices are disclosed. One optical computing device includes an electromagnetic radiation source that emits electromagnetic radiation into an optical train to optically interact with a sample and at least one integrated computational element, the sample being configured to generate optically interacted radiation. A sampling window is arranged adjacent the sample and configured to allow transmission of the electromagnetic radiation therethrough and has one or more surfaces that generate one or more stray signals. A first focal lens is arranged to receive the optically interacted radiation and the one or more stray signals and generate a primary focal point from the optically interacted radiation. A structural element defines a spatial aperture aligned with the primary focal point such that the optically interacted radiation is able to pass therethrough while transmission of the one or more stray signals is substantially blocked by the structural element.

A system and method are disclosed for reconstructing contrast-enhanced CT images that are substantially free of beam-hardening artifacts. An imaging system includes a radiation source configured to project radiation toward an object to be scanned and an energy discriminating detector assembly having a plurality of detector elements and configured to detect radiation emitted by the radiation source and attenuated by the object to be scanned. The imaging system also includes computer programmed to count a number of photons detected by each detector element and associate an energy value to each counted photon and determine a material composition of a CT view from the number of photons counted and the energy value associated with each counted photon. The computer is also programmed to apply a weighting to the CT view based on the material composition of the CT view and reconstruct an image with differential weighting based on the weighting of the CT view.

Optical computing devices are disclosed. One exemplary optical computing device includes an electromagnetic radiation source configured to optically interact with a sample and first and second integrated computational elements arranged in primary and reference channels, respectively, the first and second computational elements are configured to be either positively or negatively correlated to the characteristic of the sample. The first and second integrated computational elements produce first and second modified electromagnetic radiations, and a detector is arranged to receive the first and second modified electromagnetic radiations and generate an output signal corresponding to the characteristic of the sample.