Semiconductor thin film field effect transistor of a kind of unstable two-dimensional material and preparation method thereof
A technology of thin film field effect and two-dimensional materials, which is applied in semiconductor/solid-state device manufacturing, semiconductor devices, transistors, etc. The effect of small hysteresis and short exposure time
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Embodiment 1
[0059] A semiconductor thin film field effect transistor of an unstable two-dimensional material, which comprises a silicon wafer substrate, an unstable two-dimensional material, an aluminum oxide film, a source electrode and a drain electrode sequentially from bottom to top.
[0060] Unstable two-dimensional materials are indium selenide (InSe), black phosphorus, transition metal sulfides, or III-VI compounds. The thickness of the unstable 2D material is 20-80nm. The aluminum oxide thin film has a thickness of 20 nm.
Embodiment 2
[0062] According to the semiconductor thin film field effect transistor of an unstable two-dimensional material described in Embodiment 1, the difference lies in that the thickness of the aluminum oxide film is 40 nm.
Embodiment 3
[0064] According to the semiconductor thin film field effect transistor of an unstable two-dimensional material described in Embodiment 1, the difference lies in that the thickness of the aluminum oxide film is 30 nm. The 30nm alumina can play a better isolation effect, so that the process solvent and air have less influence on the semiconductor material, and at the same time, the photoresist will not be etched too much due to the relatively small etching selection during the rear etching. This results in difficulty in electrode stripping.
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