Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Preparation method of photodiode and photodiode

A technology of photodiodes and diodes, which is applied in the direction of circuits, electrical components, semiconductor devices, etc., can solve the problems of affecting the surface state of photodiodes, reducing the reliability of photodiodes, and contamination of photodiodes, so as to improve work stability, reduce pollution and Effect of ion damage, stain and damage prevention

Active Publication Date: 2022-02-08
勒威半导体技术(嘉兴)有限公司
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] At present, according to different performance parameters of photodiodes, they are applied to different fields. In the actual preparation process of photodiodes, mutual dissolution between metals and semiconductors often occurs when etching metals, resulting in contamination or damage to photodiodes. This greatly affects the surface state of the photodiode and reduces the reliability of the photodiode

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Preparation method of photodiode and photodiode
  • Preparation method of photodiode and photodiode
  • Preparation method of photodiode and photodiode

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0023] In order to understand the specific technical solutions, features and advantages of the present invention more clearly, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0024] In the description of the present invention, it should be noted that the terms "upper", "lower", "left", "right", "transverse", "longitudinal", "horizontal", "inner", "outer" etc. indicate The orientation or positional relationship is based on the orientation or positional relationship shown in the drawings, or the orientation or positional relationship that is usually placed when the product of the invention is used, and is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying the It should not be construed as limiting the invention that a device or element must have a particular orientation, be constructed, and operate in a particular ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
Login to View More

Abstract

The invention provides a method for preparing a photodiode, including S101: forming an oxide layer on a substrate; S102: forming two first grooves separated by an oxide layer, and forming a first implantation region at the bottom of the two first grooves; S103: Form a first opening, two second trenches, and a second opening between the two second trenches on the substrate, and implant ions into corresponding positions to form a second implantation region, a third implantation region, and a fourth implantation region area; S104: remove the oxide layer, and form a dielectric layer on the substrate; S105: etch the dielectric layer on the first implantation region and the third implantation region to form a contact hole, and then form a metal layer in the dielectric layer and the contact hole ; S106: firstly apply a photoresist layer on the upper surface of the metal layer and both sides of the metal layer, etch and remove the dielectric layer not covered by the photoresist layer, then remove the photoresist layer, and finally obtain a photodiode. The present invention also provides a photodiode with improved surface state and reliability.

Description

technical field [0001] The invention relates to the technical field of semiconductor chip manufacturing technology, in particular to a method for preparing a photodiode and the photodiode. Background technique [0002] Ordinary diodes are in a cut-off state when the reverse voltage is applied, and only a weak reverse current can flow. When designing and manufacturing photodiodes, try to make the area of ​​the PN junction relatively large in order to receive incident light. Photodiodes work under the action of reverse voltage. When there is no light, the reverse current is extremely weak, which is called dark current; when there is light, the reverse current rapidly increases to tens of microamperes, which is called photocurrent. The greater the intensity of the light, the greater the reverse current. The change of light causes the current change of the photodiode, which can convert the light signal into an electrical signal and become a photoelectric sensing device. [000...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L31/0352H01L31/102H01L31/18
Inventor 不公告发明人
Owner 勒威半导体技术(嘉兴)有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products