Growth method of LED epitaxial contact layer
A growth method and contact layer technology, applied in the direction of electrical components, circuits, semiconductor devices, etc., can solve problems such as increased working voltage
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Embodiment 1
[0055] The invention uses VEECO MOCVD to grow high-brightness GaN-based LED epitaxial wafers. Using high-purity H 2 or high purity N 2 or high purity H 2 and high purity N 2 The mixed gas as the carrier gas, high-purity NH 3 As N source, metal-organic source trimethylgallium (TMGa), metal-organic source triethylgallium (TEGa), trimethylindium (TMIn) as indium source, N-type dopant is silane (SiH 4 ), trimethylaluminum (TMAl) as the aluminum source, and the P-type dopant as magnesium dicene (CP 2 Mg), the substrate is (0001) sapphire, and the reaction pressure is between 100Torr and 1000Torr. The specific growth method is as follows (for the epitaxial structure, please refer to figure 1 ):
[0056] The present invention provides a LED epitaxial contact layer growth method, see figure 2 , including in turn: step 101, processing the substrate; step 102, growing a low-temperature GaN nucleation layer; step 103, growing a high-temperature GaN buffer layer; step 104, growin...
Embodiment 2
[0064] The invention uses VEECO MOCVD to grow high-brightness GaN-based LED epitaxial wafers. Using high-purity H 2 or high purity N 2 or high purity H 2 and high purity N 2 The mixed gas as the carrier gas, high-purity NH 3 As N source, metal-organic source trimethylgallium (TMGa), metal-organic source triethylgallium (TEGa), trimethylindium (TMIn) as indium source, N-type dopant is silane (SiH 4 ), trimethylaluminum (TMAl) as the aluminum source, and the P-type dopant as magnesium dicene (CP 2 Mg), the substrate is (0001) sapphire, and the reaction pressure is between 100Torr and 1000Torr. The specific growth method is as follows (for the epitaxial structure, please refer to figure 1 ):
[0065] 1. Treat the substrate, specifically:
[0066] H at 1050°C-1150°C 2 atmosphere, the sapphire is annealed and the substrate surface is cleaned.
[0067] 2. Growth of low-temperature GaN nucleation layer, specifically:
[0068] Cool down to 500°C-620°C, feed NH 3 and TMGa, ...
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