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Preparation method for metal matrix composite material sample suitable for EBSD (Electron Backscattered Diffraction) detection

A composite material, metal-based technology, applied in the preparation of test samples, material analysis using wave/particle radiation, analyzing materials, etc., to achieve low stress values

Inactive Publication Date: 2015-03-25
BEIJING INSTITUTE OF TECHNOLOGYGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] Aiming at the problem that the metal matrix composite material EBSD detection sample prepared by the existing preparation method cannot simultaneously meet the requirements of high surface smoothness, low stress value and retaining the original surface stress distribution law of the sample to be tested, the invention provides a method suitable for EBSD detection The preparation method of the metal matrix composite material sample; The method adopts wire cutting, mechanical polishing, vibration polishing-ion polishing-vibration polishing process to process the metal matrix composite material with multi-phase structure, and obtain the metal matrix composite material suitable for EBSD detection matrix composite material sample, the sample simultaneously meets the requirements of high surface smoothness, low stress value and the original surface stress distribution law of the reserved sample

Method used

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  • Preparation method for metal matrix composite material sample suitable for EBSD (Electron Backscattered Diffraction) detection
  • Preparation method for metal matrix composite material sample suitable for EBSD (Electron Backscattered Diffraction) detection
  • Preparation method for metal matrix composite material sample suitable for EBSD (Electron Backscattered Diffraction) detection

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0032] (1) Molybdenum wire is used as the cutting wire, and the cutting speed is 0.1mm / min on SiC 3D Extract the EBSD test sample 1 with a size of 3×4×10mm from the Al metal matrix composite material;

[0033] (2) Use SiC sandpaper of different meshes to grind the EBSD sample 1 successively from low to high; use SiO with different sizes of internal polishing particles 2 The solution polishes the samples polished by sandpaper from large to small; among them, the number of sandpaper meshes is from 200 mesh to 2000 mesh, SiO 2 The size of the polishing particles inside the solution ranges from 1.5 μm to 0.5 μm.

[0034] (3) Vibration polishing is performed on the EBSD sample 2 to be tested, and the vibration polishing time is 5min; the vibration frequency is 1000Hz, and a load of 50g is applied; after the vibration polishing is completed, ion polishing is performed on the EBSD sample 2 to be tested after the vibration polishing process , the ion polishing time is 1min; the curr...

Embodiment 2

[0038] (1) Using molybdenum wire as the cutting wire, extract an EBSD sample 1 with a size of 3×4×10mm on the SiCp / Cu metal matrix composite material at a cutting speed of 2mm / min;

[0039] (2) Using different mesh Al 2 o 2 Sandpaper, grind the EBSD test sample 1 successively from low to high; use Al with different sizes of internal polishing particles 2 o 3 After the solution polished the sandpaper, the sample was polished successively from high to low; among them, the number of sandpaper was from 200 mesh to 2000 mesh, Al 2 o 3 The size of the polishing particles inside the solution ranges from 1.5 μm to 0.5 μm.

[0040](3) Vibration polishing is carried out on the EBSD sample 2 to be tested, and the vibration polishing time is 60min; the vibration frequency is 10000Hz, and a load of 500g is applied; after the vibration polishing is completed, ion polishing is performed on the EBSD sample 2 to be tested after the vibration polishing process , the ion polishing time is 5...

Embodiment 3

[0044] The detection material is SiC p / Al metal matrix composite material, the preparation process is as follows:

[0045] (1) Molybdenum wire is used as the cutting wire, and the cutting speed is 1mm / min on SiC p Extract the EBSD test sample 1 with a size of 3×4×10mm from the Al metal matrix composite material;

[0046] (2) Use SiC sandpaper of different meshes to grind the EBSD sample 1 successively from low to high; use Al with different sizes of internal polishing particles 2 o 3 After the solution polished the sandpaper, the sample was polished successively from high to low; among them, the number of sandpaper was from 200 mesh to 2000 mesh, Al 2 o 3 The size of the polishing particles inside the solution ranges from 1.5 μm to 0.5 μm.

[0047] (3) Vibration polishing is performed on the EBSD sample 2 to be tested, and the vibration polishing time is 30min; the vibration frequency is 5000 Hz, and a load of 200g is applied; after the vibration polishing is completed, ...

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Abstract

The invention discloses a preparation method for a metal matrix composite material sample suitable for EBSD (Electron Backscattered Diffraction) detection, and belongs to the field of preparation of detection samples. The preparation method is used for processing a metal matrix composite material with a multiphase structure by utilizing linear cutting, mechanical polishing, and vibration polishing-ion polishing-vibration polishing processes so as to obtain the metal matrix composition material sample suitable for the EBSD detection. The obtained metal matrix composition material sample simultaneously meets requirements on high surface smoothness and a low stress value and the requirement of keeping the original surface stress distribution rule of the sample; the EBSD detection requirements of different-type metal matrix composite materials are met, and preparation requirements of detection samples for performing various detections, such as XRD detection and Raman spectrum detection, on different-type multiphase conducting materials are also met.

Description

technical field [0001] The invention relates to a method for preparing a metal matrix composite material sample suitable for EBSD detection, in particular to a metal matrix composite material that meets the detection requirements of Electron Backscattered Diffraction (Electron Backscattered Diffraction, EBSD for short). The invention discloses a material testing sample preparation method, belonging to the field of testing sample preparation. Background technique [0002] Compared with metal materials, metal matrix composites have the characteristics of low density, high specific strength, high specific modulus, and low thermal expansion coefficient, so they become ideal substrate materials for various multi-chip components and high-current power modules. EBSD is a commonly used method to characterize the mechanical properties of metal matrix composites, and it is suitable for characterizing material properties such as texture orientation and stress distribution of metal phas...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N1/28G01N1/32G01N23/203
Inventor 薛辽豫王富耻王扬卫马壮
Owner BEIJING INSTITUTE OF TECHNOLOGYGY
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