Mems piezoresistive pressure sensor with no strain film structure and manufacturing method thereof
A pressure sensor, membrane structure technology, applied in the measurement of the property force of piezoresistive materials, microstructure devices composed of deformable elements, microstructure technology, etc., can solve the problem of low overload resistance and overload resistance. limited problems, to achieve good performance, high yield, and avoid the fluctuation of strain film thickness
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[0033] The present invention will be further described below through specific embodiments and accompanying drawings.
[0034] The preparation method of the MEMS piezoresistive pressure sensor in this embodiment is to etch two pairs of piezoresistive strips along the crystal direction and crystal direction on the substrate after P-type ion implantation and doping. The resistance bars are connected end to end to form a rhombus. The steps of the method include:
[0035] 1) Select (100) crystal plane single crystal silicon wafer or (100) crystal plane SOI silicon wafer as the chip substrate;
[0036] 2) P-type light doping is completed by ion implantation on the front of the substrate; the doping concentration required for the piezoresistor is completed, and high-temperature thermal annealing activates the implanted ions;
[0037] 3) The heavily doped contact area is defined by photolithography, and P-type heavy doping is carried out by ion implantation; after completion, high...
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