BiCMOS (bipolar complementary metal oxide semiconductor) integrated device based on plane-strained SiGe HBT (heterojunction bipolar transistor) device and fabrication method
An integrated device, plane strain technology, applied in semiconductor/solid-state device manufacturing, electric solid-state devices, semiconductor devices, etc., can solve problems such as affecting device performance, difficult to meet design, and inability to meet low power consumption
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Embodiment 1
[0123] Embodiment 1: The BiCMOS integrated device and circuit based on the plane-strained SiGe HBT device with a channel length of 22nm are prepared, and the specific steps are as follows:
[0124] Step 1, SOI substrate material preparation.
[0125] (1a) Select the N-type doping concentration as 1×10 15 cm -3 The Si sheet is oxidized on its surface, and the thickness of the oxide layer is 1 μm, which is used as the base material of the upper layer, and hydrogen is injected into the base material;
[0126] (1b) Select the N-type doping concentration as 1×10 15 cm -3 The Si sheet is oxidized on its surface, and the thickness of the oxide layer is 1 μm, which is used as the base material of the lower layer;
[0127] (1c) Using a chemical mechanical polishing (CMP) process to polish the surface of the lower layer and the upper layer of substrate material after hydrogen injection;
[0128](1d) Put the oxide layer on the surface of the polished lower layer and the upper layer ...
Embodiment 2
[0193] Embodiment 2: The BiCMOS integrated device and circuit based on the plane-strained SiGe HBT device with a channel length of 130 nm are prepared, and the specific steps are as follows:
[0194] Step 1, SOI substrate material preparation.
[0195] (1a) Select the N-type doping concentration as 3×10 15 cm -3 The Si sheet is oxidized on its surface, and the thickness of the oxide layer is 0.7 μm, which is used as the base material of the upper layer, and hydrogen is injected into the base material;
[0196] (1b) Select the N-type doping concentration as 3×10 15 cm -3 The Si sheet is oxidized on its surface, and the thickness of the oxide layer is 0.7 μm, which is used as the base material of the lower layer;
[0197] (1c) Using a chemical mechanical polishing (CMP) process to polish the surface of the lower layer and the upper layer of substrate material after hydrogen injection;
[0198] (1d) Put the oxide layer on the surface of the polished lower layer and the upper...
Embodiment 3
[0263] Embodiment 3: The BiCMOS integrated device and circuit based on the plane-strained SiGe HBT device with a channel length of 350 nm are prepared, and the specific steps are as follows:
[0264] Step 1, SOI substrate material preparation.
[0265] (1a) Select the N-type doping concentration as 5×10 15 cm -3 The Si sheet is oxidized on its surface, and the thickness of the oxide layer is 0.5 μm, which is used as the base material of the upper layer, and hydrogen is injected into the base material;
[0266] (1b) Select the N-type doping concentration as 5×10 15 cm -3 The Si sheet is oxidized on its surface, and the thickness of the oxide layer is 0.5 μm, which is used as the base material of the lower layer;
[0267] (1c) Using a chemical mechanical polishing (CMP) process to polish the surface of the substrate material of the lower layer and the upper layer of the active layer after injecting hydrogen, respectively;
[0268] (1d) Put the oxide layer on the surface of ...
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