Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for improving resistance to wheat sharp eyespot

A wheat sheath blight and resistance technology, which is applied in the field of wheat breeding and molecular biology, can solve the problems of strong periodicity, difficulty, affecting the progress of resistance improvement of wheat sheath blight, etc., and achieves short cycle and strong pertinence. , the effect of reducing the dependence of artificial experience

Inactive Publication Date: 2010-04-21
JIANGSU ACADEMY OF AGRICULTURAL SCIENCES
View PDF0 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the complexity of genetic methods, it brings many difficulties to conventional breeding, such as strong periodicity and poor predictability, which directly affects the progress of wheat sheath blight resistance improvement.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for improving resistance to wheat sharp eyespot
  • Method for improving resistance to wheat sharp eyespot
  • Method for improving resistance to wheat sharp eyespot

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0028] Using pAHC25 as the basic plasmid, use restriction endonucleases Xba I and Bgl II to partially digest the pAHC25 plasmid DNA, excise the bar gene contained in the plasmid, and perform 0.8% agarose electrophoresis to recover a large DNA fragment of about 9.1Kb. The rabbit defensin NP-1 gene with Xba I and Bgl II restriction sites added before the start codon ATG and after the stop codon TGA respectively (the DNA base sequence deduced from the amino acid sequence of GenBank: AAB21588 adds the ATG start codon and stop codon TGA, complete DNA sequence see seq1) DNA fragment, using T 4 DNA ligase ligated overnight at 16°C (25ul reaction system containing 1×T 4 DNA ligase buffer, large plasmid fragment 0.3pmol, rabbit defensin NP-1 gene fragment 0.03pmol, 35uT 4 DNA ligase, the ligation product was transformed into Escherichia coli DH5α competent cells (for the transformation method, refer to the second edition of "Molecular Cloning Experiment Guide", pages P55-56, Science P...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to the field of molecular biology, in particular to a method for improving the resistance of wheat to sharp eyespot by adopting a genetic engineering method to introduce a rhizoma gastrodiae antifungal protein gene and a rabbit defensin gene into conventional wheat and expressing. The method for improving resistance to wheat sharp eyespot comprises the following steps: constructing an expression vector pAHC-NP-GAFP of the rhizoma gastrodiae antifungal protein gene and the rabbit defensin gene; introducing the pAHC-NP-GAFP into receptor-wheat immature embryo cells through particle bombardment, performing callus induction and plant regeneration on the wheat immature embryo cells to obtain transgenic candidate plants, obtaining positive transgenic plants through molecular detection and obtaining T5-generation transgenic homozygous lines from the positive transgenic plants through inbreeding and PCR screening; performing sharp eyespot resistance screening on progenies of the T5-generation transgenic homozygous lines; and screening out the transgenic plant with improved resistance to sharp eyespot. The method has the advantages that the method has the characteristics of strong pertinence, short cultivation period and little influence on important agronomic characters compared with conventional planting-cultivating methods.

Description

technical field [0001] The invention relates to the fields of wheat breeding and molecular biology. The antifungal protein gene and defensin gene of Gastrodia elata are introduced into and expressed in conventional wheat by using a genetic engineering method, so as to increase the sheath blight resistance of wheat. Background technique [0002] Wheat sheath blight, also known as wheat sharp eyespot, is an important worldwide soil disease caused by Rhizoctonia cerealis Vander hoeven and Rhizoctonia solani Kuhn. Transmission of fungal diseases was reported abroad as early as 1934. In 1973, the disease was also discovered in my country. Since the 1980s, with the continuous improvement of fertilization level, the change of farming system and the large-scale promotion of susceptible varieties, sheath blight has become the main disease in the wheat region of the Yangtze River Basin in my country, and gradually spread to the Huanghuai wheat region. In recent years, it has occurred...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): C12N15/82A01H1/02
Inventor 周淼平任丽娟张鹏余桂红孙晓波张旭马鸿翔
Owner JIANGSU ACADEMY OF AGRICULTURAL SCIENCES
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com