The invention discloses a block-box testing case design method based on combination with a basic path method. The method comprises the following steps: S1, according to a
chip manual, an internal process flow of a private VIAN of the
chip is found out; S2, an internal process
flow chart of the private VIAN is drawn; S3, with a basic path method of a white-box testing method, independent path branches of the internal process
flow chart of the private VIAN are listed, all independent path branches and a main path form N independent paths, and each independent path in the
flow chart is executed at least once; and S4, according to the N independent paths, parameters of a data sending instrument and a data forwarding instrument are set one path by one path, the data sending instrument sends data to the data forwarding instrument successively, and a result of
data processing by the data forwarding instruction when the corresponding independent path is executed is obtained. According to the method, the obtained case is close to internal implementation of the product; and the minimized testing efficiency can be realized by using minimal cases.