Block-box testing case design method based on combination with basic path method

Abstract

The invention discloses a block-box testing case design method based on combination with a basic path method. The method comprises the following steps: S1, according to a chip manual, an internal process flow of a private VIAN of the chip is found out; S2, an internal process flow chart of the private VIAN is drawn; S3, with a basic path method of a white-box testing method, independent path branches of the internal process flow chart of the private VIAN are listed, all independent path branches and a main path form N independent paths, and each independent path in the flow chart is executed at least once; and S4, according to the N independent paths, parameters of a data sending instrument and a data forwarding instrument are set one path by one path, the data sending instrument sends data to the data forwarding instrument successively, and a result of data processing by the data forwarding instruction when the corresponding independent path is executed is obtained. According to the method, the obtained case is close to internal implementation of the product; and the minimized testing efficiency can be realized by using minimal cases.

Description

technical field [0001] The invention relates to the technical field of communication testing, in particular to a black-box test case design method combined with a basic path method. Background technique [0002] With the wide application of switches, switches are strictly tested in the R&D stage to achieve close to the internal requirements of the product and realize the functions of the product. However, many test case design methods for switches are based on protocol functions and full black box design, such as Equivalence class division, boundary value method, etc. There are a lot of input for the use cases designed in this way, but in fact, many product problems are hidden deeply and are closely related to the internal chip processing of the switch, so it is impossible to conduct a comprehensive test on the switch, and the function test is not in place. , but it is possible to miss a lot of important input. [0003] Therefore, those skilled in the art have been devoting...

AI Technical Summary

Problems solved by technology

[0002] With the wide application of switches, switches are strictly tested in the R&D stage to achieve close to the internal requirements of the product and realize the functions of the product. However, many test case design methods for switches are based on protocol functions and full black box design, such as Equivalence class division, boundary value method, etc. There are a lot of input for the use cases designed in this way, but in fact, many product problems are hidden deeply and are closely related to the internal chip processing of the switch, so it is impossible to conduct a comprehensive test on the switch, and the function test is not in place. , but it is possible to miss a lot of important input

Images