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Sample preparation method for in-situ observation of dislocation slip traces by transmission electron microscope

A transmission electron microscope and sample preparation technology, which is applied in the preparation of test samples, material analysis and sampling using wave/particle radiation, etc. It can solve the inconvenience of analysis, difficulty in finding suitable samples, uncertain loading force of polycrystalline materials, etc. question

Inactive Publication Date: 2021-03-30
INST OF METAL RESEARCH - CHINESE ACAD OF SCI
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  • Application Information

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Problems solved by technology

However, the above methods have inevitable defects. Method (1) not only needs to be equipped with a high-precision in-situ transmission sample rod, but also requires the operator to have very professional experimental skills; , it is difficult to find a suitable sample, and the uncertainty of the loading force on the polycrystalline material also brings inconvenience to the subsequent analysis

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  • Sample preparation method for in-situ observation of dislocation slip traces by transmission electron microscope
  • Sample preparation method for in-situ observation of dislocation slip traces by transmission electron microscope
  • Sample preparation method for in-situ observation of dislocation slip traces by transmission electron microscope

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Embodiment 1

[0020] This embodiment provides a sample preparation method for in-situ observation of dislocation slip traces by a transmission electron microscope, such as figure 1 As shown, it mainly includes the following steps:

[0021] Step 1: Sample cutting and processing, the specific method is: first use wire cutting equipment to cut thin slice samples on the alloy material along the radial direction of the button ingot; then use 150#, 320#, 800# and 2000# sandpaper to grind the samples in turn , and thin it to 40 microns; finally, use a puncher to make a sample sheet with a diameter of 3mm suitable for transmission electron microscope observation.

[0022] Step 2: Surface polishing; use double spray equipment to remove the grinding marks and residual stress on the surface of the sample treated in step 1; among them, only need to remove the grinding scratches and slightly corrode the grain boundaries, and ensure that no small holes appear; The specific parameters of the double spray...

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Abstract

The invention relates to a sample preparation method for observation and analysis by a transmission electron microscope, in particular to a sample preparation method for in-situ observation of dislocation slip traces by the transmission electron microscope. The sample preparation method comprises the following steps: cutting and processing a sample; polishing the surface; loading the Vickers hardness; and thinning and carrying out subsequent observation and analysis. The sample is relatively simple to prepare, and high-precision instruments and equipment are not needed; by adopting the methodprovided by the invention, the direction and size of the loading force can be accurately determined, and the characteristics of the slip trace near the indentation are determined in situ. By means ofthe transmission electron microscope, the dislocation slip trace characteristics can be observed, and the dislocation slip trace characteristics of the material under the action of an external load can be observed and analyzed in situ through indentation positioning, so that the purpose of in-situ research on the microscopic deformation of the material is achieved.

Description

technical field [0001] The invention relates to a method for preparing a sample for observation and analysis by a transmission electron microscope, in particular to a method for preparing a sample for in-situ observation of dislocation slip traces by a transmission electron microscope. Background technique [0002] Alloy materials are used in all aspects of life due to their excellent mechanical properties. Studies have shown that there are two main microscopic deformation modes of materials: twinning and dislocation slip. Dislocation, also known as atomic misalignment, is a kind of microscopic defect inside the material, which can be regarded as the dividing line between the part that has slipped and the part that has not slipped in the crystal. The concept of "dislocation" was originally proposed by Taylor to explain the huge difference between the actual and theoretical strength of materials. This kind of defect is generally caused by the deviation of atoms from the ide...

Claims

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Application Information

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IPC IPC(8): G01N1/28G01N1/32G01N23/20008
CPCG01N1/28G01N1/286G01N1/32G01N23/20008G01N2001/2873
Inventor 李阁平韩福洲袁福森张英东穆罕穆德.阿里郭文斌任杰刘承泽顾恒飞
Owner INST OF METAL RESEARCH - CHINESE ACAD OF SCI
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