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Texturing method of polycrystalline silicon wafer cut by diamond wire

A diamond wire cutting, polycrystalline silicon wafer technology, applied in the direction of polycrystalline material growth, chemical instruments and methods, crystal growth, etc., can solve the problems of unstable solution, lower reflectivity of silicon wafer, large texture fluctuation, etc., and achieve easy removal. Consistent with purification treatment, etching depth, and the effect of improving production efficiency

Active Publication Date: 2016-07-27
NANJING TECH UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

This method can effectively reduce the reflectivity of silicon wafers and improve efficiency, but there are also obvious shortcomings: firstly, it cannot form uniform and small color difference on the surface of polycrystalline silicon wafers with [100], [110], [111] and other crystal planes. 1. The suede surface with high light conversion efficiency can not solve the problem of uniform appearance in mass production; secondly, in this method, the silicon wafer is placed in a mixed solution containing metal ions, oxidant hydrogen peroxide and hydrofluoric acid to form a porous layer on the surface. It is easy to cause the instability of the solution, the suede fluctuates greatly during the batch reaction, and the life of the solution is insufficient
Patent No. 201310127230.X discloses a textured structure of crystalline silicon solar cells and its preparation method. The method coats a layer of metal nanoparticles on the surface, then corrodes the surface of the silicon wafer, and finally corrects the surface of the silicon wafer. Etching, this method can effectively obtain polysilicon textured sheet with low reflectivity, but its textured structure is limited to 100-500nm, and the obtained textured sheet also has problems of uneven textured surface and large color difference

Method used

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  • Texturing method of polycrystalline silicon wafer cut by diamond wire
  • Texturing method of polycrystalline silicon wafer cut by diamond wire
  • Texturing method of polycrystalline silicon wafer cut by diamond wire

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0037] The present invention adopts the P-type 156 polysilicon wafer cut by diamond wire as the base material, and carries out the following steps of making cashmere:

[0038] (1) The cut polysilicon diamond wire slice is immersed in sodium hydroxide solution for surface treatment, and an alkali reaction control agent is added at the same time, and its concentration is 0.3%. After removing the cutting damage layer on the surface of the silicon wafer, the silicon wafer is taken out and immersed in a solution containing Cleaning is carried out in a mixed acid solution of hydrofluoric acid solution and nitric acid solution, wherein, during surface treatment, the concentration of sodium hydroxide solution is 2%, and the alkali reaction control agent is polycarboxylic acid, isooctyl alcohol polyoxyethyl ether phosphate and allyl For alcohol polyoxyalkyl ethers, the treatment temperature is 82°C, and the treatment time is 5 minutes; when cleaning, the volume ratio of hydrofluoric aci...

Embodiment 2

[0049] The basic steps are the same as in Example 1, except that the inorganic cations in step (2) are silver ions.

[0050] The reflectivity of the silicon chip sample that embodiment 1, comparative example 1 and embodiment 2 make is measured silicon chip, and above-mentioned silicon chip sample is processed as follows:

[0051] (1) Put the silicon wafer into the tubular diffusion furnace for diffusion treatment;

[0052] (2) Carry out edge etching and dephosphorous silicon glass treatment to the diffused silicon wafer;

[0053] (3) Deposit silicon nitride anti-reflection film 83nm with the method of tubular PECVD on the front after step (2) treatment;

[0054] (4) Print the back electrode and the aluminum back field on the back, and print the grid line on the front surface of the silicon wafer;

[0055] (5) Sintering to test the electrical properties of the battery sheet.

[0056] The silicon wafers prepared in embodiment 1, comparative example 1 and embodiment 2 are test...

Embodiment 3

[0066] The present invention adopts the P-type 156 polysilicon wafer cut by diamond wire as the base material, and carries out the following steps of making cashmere:

[0067] (1) Immerse the cut polysilicon diamond wire slices in sodium hydroxide solution for surface treatment, add alkali reaction control agent at the same time, its concentration is 0.1%, remove the cutting damage layer on the surface of the silicon wafer, take out the silicon wafer, and immerse it in a solution containing Cleaning is carried out in an acid solution mixed with hydrofluoric acid solution and nitric acid solution, wherein, during surface treatment, the concentration of sodium hydroxide solution is 3%, the alkali reaction control agent is polycarboxylic acid and polyethylene glycol, and the treatment temperature is 80°C. The treatment time is 5 minutes; when cleaning, the volume ratio of hydrofluoric acid and nitric acid solution is 2:1, the treatment temperature is 50°C, and the treatment time i...

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Abstract

The invention discloses a texturing method of a polycrystalline silicon wafer cut by a diamond wire. The method comprises the following steps: firstly, immersing the polycrystalline silicon wafer cut by the diamond wire into a mixed water solution of an alkaline solution and an alkaline reaction control agent, removing a surface damage layer of the silicon wafer and immersing the polycrystalline silicon wafer into a hydrofluoric acid solution containing inorganic ions and organic molecules for reaction; secondly, carrying out pretreatment on the polycrystalline silicon surface by a mixed solution of a hydrofluoric acid and hydrogen peroxide and simultaneously adding a pore-forming regulator; and finally texturing the silicon wafer surface by a mixed acid solution of the hydrofluoric acid and a nitric acid. The texturing method has the advantages that the prepared polycrystalline textured wafer is uniform in suede, small in color difference and consistent in etching depth, and has low surface reflectivity and relatively high conversion efficiency; the preparation method is simple and feasible; the reagent cost is relatively low; the reaction conditions are easy to implement; and the texturing method is relatively good in compatibility with an existing industrial production procedure and is suitable for popularization and application.

Description

technical field [0001] The invention belongs to the field of manufacturing polycrystalline silicon solar cells, and in particular relates to a method for making texture of diamond wire cut polycrystalline silicon wafers. Background technique [0002] At present, the cutting of crystalline silicon wafers used in the photovoltaic industry mainly adopts the mortar multi-wire cutting technology, but this technology has many problems such as low cutting efficiency, high cost, and discharge pollution of waste mortar after cutting. In contrast, the slicing method of diamond wire cut polysilicon ingot has attracted much attention because of its advantages of low processing cost, high cutting efficiency and clean environment. However, compared with mortar-cut silicon wafers, diamond wire-cut polycrystalline silicon wafers have a thinner surface damage layer and insufficient reactivity. The acid texturing process used in traditional mortar-cut polycrystalline silicon wafers cannot sol...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L31/0236H01L31/18C30B33/10
CPCC30B33/10H01L31/02363H01L31/1804H01L31/182C30B29/06Y02P70/50H01L31/18H01L31/0236Y02E10/50H01L21/30604H01L33/10
Inventor 管自生李军沈志妹陆春华许仲梓
Owner NANJING TECH UNIV
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