Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Preparation method for ordered silicon quantum dots in three-dimensional space

A technology of silicon quantum dots and three-dimensional space, which is applied in the field of preparation of ordered silicon quantum dots distributed in three-dimensional space, can solve the problems of large size, many defects, and small area of ​​silicon quantum dots, and achieve small size, few defects, and high density Effect

Inactive Publication Date: 2014-08-06
CHINA THREE GORGES UNIV
View PDF5 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the simple method of preparing silicon quantum dots in the S-K growth mode and few defects, it is a widely used preparation technology for silicon quantum dots. However, the random distribution of silicon quantum dots is still the main challenge for preparing silicon quantum dots in this way.
In addition, although the order of the arrangement and distribution of quantum dots can be controlled as much as possible in the vertical direction by optimizing the film thickness of each layer with a multilayer film structure, the effect is poor in the horizontal direction.
The latter methods are to prepare a patterned substrate (patterned single crystal silicon substrate technology generally mainly uses photolithography technology or ion etching technology to first engrave regular patterns on the silicon substrate through a mask. , and then use physical or chemical methods to prepare silicon quantum dots) can accurately control the nucleation position and distribution arrangement of quantum dots in the horizontal direction. These methods are considered to be the most direct and effective methods for obtaining spatially distributed and ordered silicon quantum dots in the future. However, silicon quantum dots prepared by these methods generally have disadvantages such as large size, small area, and many defects due to the constraints of photolithographic dimensional accuracy, chemical corrosion reagent pollution, and other inherent properties.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0028] A method for preparing ordered silicon quantum dots distributed in three-dimensional space, the method comprising the following steps:

[0029] 1) Preparation of solution: Mix potassium hydroxide, deionized water and isopropanol and stir evenly to prepare the required solution; the volumes of deionized water and isopropanol required per gram of potassium hydroxide are 0.5ml and 1.5ml respectively ;

[0030] 2) Prepare a patterned single crystal silicon substrate: place the single crystal silicon substrate in the solution prepared in step 1), and keep it in a constant temperature water bath at 35°C for 3 minutes, and the average line length of the pattern is 170nm;

[0031] 3) Depositing silicon nitride thin films: using plasma-enhanced chemical vapor deposition technology to prepare silicon nitride thin films on patterned single crystal silicon;

[0032] 4) Depositing a microcrystalline silicon film: depositing a microcrystalline silicon film on the silicon nitride fil...

Embodiment 2

[0044] A method for preparing ordered silicon quantum dots distributed in three-dimensional space, the method comprising the following steps:

[0045] 1) Preparation of solution: Mix potassium hydroxide, deionized water and isopropanol and stir evenly to prepare the required solution; the volumes of deionized water and isopropanol required per gram of potassium hydroxide are 0.5ml and 1.5ml respectively ;

[0046] 2) Prepare a patterned single crystal silicon substrate: place the single crystal silicon substrate in the solution prepared in step 1), keep it in a constant temperature water bath at 40°C for 7 minutes, and the average line length of the pattern is 200nm;

[0047] 3) Depositing silicon nitride thin films: using plasma-enhanced chemical vapor deposition technology to prepare silicon nitride thin films on patterned single crystal silicon;

[0048] 4) Depositing a microcrystalline silicon film: depositing a microcrystalline silicon film on the silicon nitride film pr...

Embodiment 3

[0060] A method for preparing ordered silicon quantum dots distributed in three-dimensional space, the method comprising the following steps:

[0061] 1) Preparation of solution: Mix potassium hydroxide, deionized water and isopropanol and stir evenly to prepare the required solution; the volumes of deionized water and isopropanol required per gram of potassium hydroxide are 0.6ml and 1.8ml respectively ;

[0062] 2) Prepare a patterned single crystal silicon substrate: place the single crystal silicon substrate in the solution prepared in step 1), and keep it in a constant temperature water bath at 40°C for 5 minutes, and the average line length of the pattern is 160nm;

[0063] 3) Depositing silicon nitride thin films: using plasma-enhanced chemical vapor deposition technology to prepare silicon nitride thin films on patterned single crystal silicon;

[0064] 4) Depositing a microcrystalline silicon film: depositing a microcrystalline silicon film on the silicon nitride fil...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A preparation method for ordered silicon quantum dots in three-dimensional space comprises the following steps of (1) preparing liquor; (2) preparing a patterning monocrystalline silicon substrate; (3) depositing a silicon nitride film; (4) depositing a microcrystalline silicon film; (5) depositing a nonstoichiometric silicon carbide film; (6) preparing a periodic multilayered film; (7) depositing a silicon nitride film on the prepared periodic multilayered film according to the step (3) so as to obtain a multilayered film sample; (8) performing high-temperature annealing treatment on the prepared multilayered film sample to obtain an annealed multilayered film sample; and (9) performing ammonia gas plasma passivation treatment to obtain the ordered silicon quantum dots in the three-dimensional space. By using the preparation method for ordered silicon quantum dots in the three-dimensional space, a multilayered film self-assembling technology and a patterning monocrystalline silicon substrate technology are fused integrally; and the prepared silicon quantum dots have the characteristics that the preparation area is large, the ordered silicon quantum dots have small defects and are distributed and arrayed in the three-dimensional space orderly, and the nucleation sites and the nucleation sizes are controllable.

Description

technical field [0001] The invention relates to the technical field of manufacturing silicon-based semiconductor devices, in particular to a preparation method of three-dimensional spatially distributed ordered silicon quantum dots. Background technique [0002] Due to the quantum confinement effect, silicon quantum dots have potential applications in various high-performance microelectronics and optoelectronic devices. At present, the preparation technology of silicon quantum dots has become a research hotspot and frontier topic in the world. Studies have found that the excellent physical properties of silicon quantum dots depend to a large extent on the orderliness of their spatial distribution. The more orderly the silicon quantum dots are arranged, the better the corresponding optoelectronic device performance will be. At present, the main challenge for the commercial application of silicon quantum dots is how to prepare silicon quantum dot arrays with large area, few d...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/314H01L21/18B82Y40/00
CPCB82Y40/00H01L21/02381H01L21/02532H01L21/0262H01L21/02664
Inventor 姜礼华谭新玉肖婷向鹏
Owner CHINA THREE GORGES UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products