High-performance chip condition monitoring and protection circuit for high-voltage integrated circuits

Abstract

The invention discloses a high-performance chip state monitoring and protection circuit for high-voltage integrated circuits. The circuit includes: a high-precision and wide-voltage range over-temperature protection circuit, a high-precision and high-reliability under-voltage protection circuit, and a high-precision and high-reliability over-current protection circuit. circuits and error handling logic circuits. The high-performance chip state monitoring and protection circuit provided by the present invention, on the one hand, uses a common-mode interference detection circuit in the temperature protection circuit to avoid common-mode noise interference, and locks the temperature protection signal in advance when the common-mode noise exceeds a threshold; on the other hand On the one hand, the power supply glitch detection circuit is used in the undervoltage protection circuit, and the output reset signal is locked in advance to lock the undervoltage protection signal under abnormal conditions; In addition to the influence of high-frequency noise, a certain amount of hysteresis is maintained, thereby producing a stable and reliable protection output signal stability.

Description

technical field [0001] The invention relates to a high-performance chip state monitoring and protection circuit for high-voltage integrated circuits, which belongs to the technical field of integrated circuits. Background technique [0002] Driven by emerging industries such as smart grids, mobile communications, and new energy vehicles, power electronics application systems require further improvement of system efficiency, miniaturization, and additional functions, especially the trade-off between size, quality, power, and efficiency of system equipment , such as server power management, battery chargers, and microinverters for solar farms. The new generation of power electronics system puts forward higher requirements for the reliability, speed and intelligence of its internal high-voltage integrated circuit (HVIC), so as to further improve the reliability of the whole machine and reduce the design complexity of the whole system. As a bridge between the signal processing ...

AI Technical Summary

Problems solved by technology

The high-side circuit always maintains VHB–SW≈VDD, and SW swings between 0 and VH, resulting in huge fluctuations in the power supply voltage and substrate potential of the high-side circuit, resulting in very serious common-mode noise

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