Lead frame for semiconductor packaging and preparation method thereof
A lead frame and semiconductor technology, which is applied in semiconductor/solid-state device manufacturing, semiconductor devices, semiconductor/solid-state device components, etc., can solve the impact on the reliability of packaged products, the electroplating layer is easily damaged or scratched, and wire bonding can be increased Height and other issues to achieve the effect of reducing chemical damage, good wire bonding performance, avoiding warping or strength reduction
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Embodiment 1
[0040] Embodiment 1 provides a lead frame for semiconductor packaging, which is prepared by the following method:
[0041] (1) Film: Prepare the substrate 1 that has been degreased, cleaned and dried, such as figure 1 As shown in (a), a layer of dry film 21, 22 is respectively attached to the upper and lower surfaces of the substrate. After the dry film is pasted, as shown in figure 1 as shown in (b);
[0042] (2) Microetching: such as figure 1 (c) and figure 1(d), aligning the black and white negative film with the substrate, exposing and transferring the image of the part to be removed to the dry film 21 on the upper surface 11 of the substrate; and then developing to remove the part of the dry film that has not undergone photopolymerization, exposing The area 3 to be electroplated on the upper surface of the lead frame unit; then spray the substrate with a microetching solution composed of copper chloride, sodium chlorate and hydrochloric acid to remove part of the thick...
Embodiment 2
[0048] The lead frame provided in embodiment two, the preparation process is the same as that in embodiment one, and the difference with embodiment one is only that H + The concentration is 3-3.3 mol / L; other parameters are the same as in Example 1.
[0049] It is determined that in this embodiment the thickness of the microetched groove is 8 μm, the thickness of the electroplating layer is 8 μm, and the overall thickness of the lead frame is 0.15 mm.
Embodiment 3
[0051] The preparation process of the lead frame provided in the third embodiment is the same as that in the first embodiment, and the only difference from the first embodiment is that the temperature of the microetching treatment is 56-58° C.; other parameters are the same as those in the first embodiment.
[0052] It has been determined that the thickness of the microetching groove in this embodiment is 9 μm, the thickness of the electroplating layer is 9 μm, and the overall thickness of the lead frame is 0.15 mm.
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