Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for calculating resistivity of residual materials in continuous drawing single crystal rod pot

A calculation method and resistivity technology, which is applied in the field of calculation of the resistivity of the remaining material in the pot for continuous drawing of single crystal ingots, and can solve the problems of affecting the yield rate, large deviation in resistivity estimation, scrapped head resistivity at the tail, etc.

Inactive Publication Date: 2020-07-03
ADVANCED QUARTZ MATERIAL (HANGZHOU) CO LTD
View PDF6 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] When pulling multi-rod monocrystalline silicon, the existing pulling method is to fix the length of crystal rods such as 1 rod, 2 rods, 3 rods, etc., and estimate 1 rod, 2 rods, and 3 rods according to a diameter ... Wait for the weight of the ingot, calculate the weight of the remaining material in the crucible according to the estimated weight of the ingot, and then calculate the resistivity of the remaining material in the crucible according to the segregation phenomenon, that is, the remaining material in the crucible according to this method. The material resistivity of 1 rod is the same value, and the value of 2 rods is the same value. In this way, when the diameter of each furnace differs greatly during calculation, the weight of the material in the remaining crucible will vary greatly, which will cause a large deviation in the resistivity estimate.
[0003] If the segregation coefficient is large, or the resistivity requirement of the ingot is small, such as boron-doped single crystal, the resistivity is less than 10Ω.cm, and the calculation according to this method has little effect on the resistivity of the subsequent rods, and can even be used directly Calculate the dopant dose by the weight of the added material, and ignore the resistance furnace of the remaining material in the crucible, which will not cause too many tails to be scrapped due to low resistivity; but if the segregation coefficient is small, or the resistivity of the ingot is required to be high , such as phosphorus-doped, high-resistance single crystal (resistivity may reach 100), when pulling this type of single crystal, the relatively accurate resistivity of the remaining material in the crucible is not known, but it is estimated according to the estimate, which may easily cause the resistivity of the head Too low will cause the tail to be scrapped or the resistivity of the head is too high, and the head will be scrapped, which will affect the yield and increase the production cost

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for calculating resistivity of residual materials in continuous drawing single crystal rod pot
  • Method for calculating resistivity of residual materials in continuous drawing single crystal rod pot
  • Method for calculating resistivity of residual materials in continuous drawing single crystal rod pot

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0036] Such as drawing phosphorus-doped N-type single crystal, the segregation coefficient is 0.38, and the method for calculating the resistivity of the material in the pot by the method of the present invention and the confirmation process of the calibration coefficient a are as follows:

[0037] 1. The first furnace: the first rod and the second rod are drawn by casting pure polycrystalline, the resistivity of the remaining material in the crucible of the first rod is calculated according to formula 1, the default calibration coefficient a=1, and the resistivity of the head is controlled by 3, as follows surface:

[0038]

[0039] The difference in the actual head resistivity of the two rods is farther from the setting than that of the first rod. Because the cast is pure polycrystalline, the difference in the resistivity of the two rods is mainly caused by the inaccurate resistivity of the material in the remaining crucible. Use the actual resistance of the second rod Ac...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a method for calculating the resistivity of residual materials in A continuous drawing single crystal rod pot. The electrical resistivity of the residual materials in the pot iscalculated by utilizing a formula: electrical resistivity of the remaining materials in the pot is equal to head calculation electrical resistivity *(1-B / A)(1-segregation coefficient)*segregation coefficient*a. No matter whether the crystal bar is fed after reaching the ending length or is fed after being lifted out due to equal-diameter failure; the resistivity of the materials in the pot can beaccurately calculated, then the residual weight in the pot and the resistivity of the materials are input into the doping agent calculation table and returned to the material melting column, the dosage of the doping agent is calculated, and it can be guaranteed that the resistivity of second rod, third rod,..., and the like is close to that of first rod according to the method.

Description

technical field [0001] The invention relates to the technical field of monocrystalline silicon production by the Czochralski method, in particular to a method for calculating the resistivity of the remaining material in a pot after continuously pulling a single crystal rod. Background technique [0002] When pulling multi-rod monocrystalline silicon, the existing pulling method is to fix the length of crystal rods such as 1 rod, 2 rods, 3 rods, etc., and estimate 1 rod, 2 rods, and 3 rods according to a diameter ... Wait for the weight of the ingot, calculate the weight of the remaining material in the crucible according to the estimated weight of the ingot, and then calculate the resistivity of the remaining material in the crucible according to the segregation phenomenon, that is, the remaining material in the crucible according to this method. The material resistivity of 1 rod is the same value, and the value of 2 rods is the same value. In this way, when the diameter of ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): C30B15/04C30B29/06G01N27/04
CPCC30B15/002C30B15/04C30B29/06G01N27/041
Inventor 梁万亮丁亚国马国忠林通顾燕滨河野贵之
Owner ADVANCED QUARTZ MATERIAL (HANGZHOU) CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products