Bimetallic composite wire cross section transmission sample preparation method

Abstract

The invention discloses a bimetallic composite wire cross section transmission sample preparation method, which comprises the following steps: cutting double metal wires along the direction perpendicular to drawing direction into 0.5mm circular slices; using waterproof abrasive paper for grinding the circular slices, and mechanically polishing the circular slices to mirror surface; in order to ensure the normal ion thinning, sticking a slice sample with a copper layer to a molybdenum ring with the diameter Phi of 3mm; putting the TEM sample with a pitted interface on a Gatan691 ion thinning apparatus for final processing; and using a Single ion gun mode for r thinning processing, and adjusting the angle of an ion gun. The bimetallic composite wire cross section transmission sample preparation method has the advantages of simple overall technology, mature equipment and technology, great reducing of cost of test sample preparation, and reducing of dependence on imported equipment, and the obtained sample has no pollution and no deformation, and has strong practicability.

Description

technical field [0001] The invention belongs to the technical field of sample preparation for a transmission electron microscope, and relates to a new method for preparing a material cross-section test sample for a transmission electron microscope, in particular to a double-metal composite wire cross-section with a thin coating layer that is soft on the outside and hard on the inside (large hardness difference). Preparation method of cross-sectional transmission electron microscopy samples. Background technique [0002] At present, in the field of electron microscope testing technology, due to the limitation of electron penetration ability, in order to obtain good TEM test results, first, a good TEM test sample should be prepared, a good TEM test sample standard It has a thin area that can be observed, and the thickness of the thin area is generally 20-40 μm. Therefore, the preparation of TEM test samples plays a very important role in the electron microscopy research of ma...

AI Technical Summary

Problems solved by technology

Copper-clad steel wire is not only a wire, but copper-clad steel wire is composed of pure copper and steel core with a large difference in hardness, and the copper layer is relatively thin. To prepare this kind of wire interface with high hardness of the core wire and small hardness of the cladding layer TEM samples bring great difficulties to the study of microstructure of copper-steel interface of thin-layer copper-clad steel wire

[0003] If the interface sample is still prepared by sticking the interface sample directly on the copper ring, the thin cladding layer has been completely subtracted before the sample is prepared, and a usable cross-sectional TEM interface sample cannot be obtained.

[0004] In the current technology, researchers at home and abroad mainly use FIB technology to perform fixed-point cutting and fixed-point thinning methods to prepare the cross-sectional TEM interface samples of bimetallic composite wires with a soft outer layer and a harder inner layer. In this preparation method, although the sample can reach the required thickness, the preparation cost is relatively high, and in addition, it is highly dependent on its proprietary equipment

If the experimental equipment and funds are limited, the successful preparation of the cross-sectional TEM interface samples of the bimetallic composite wire with a soft outer layer and a hard inner layer will become a key issue that hinders further research by researchers.

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