A high power density substrate embedded with diamond copper and its preparation method
A high power density, diamond technology, used in metal processing equipment, welding equipment, manufacturing tools, etc., can solve the problems of high price, low thermal conductivity, high relative density, etc., to save raw materials, high thermal conductivity, high density small effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0024] combine figure 1 and figure 2 To illustrate this example, a porous diamond preform is placed at position 2 of the near-net mold, and a high-power-density substrate with 5×20 mm rectangular diamond / copper embedded in oxygen-free copper is prepared by vacuum pressure infiltration technology, and the thermal load power is applied 400W / cm 2 , The junction temperature of the chip tested by a thermal imager is 56°C, which is 8-10°C lower than the junction temperature of the oxygen-free copper substrate.
Embodiment 2
[0026] combine figure 1 and figure 2 To illustrate this example, a porous diamond preform is placed at position 2 of the near-net mold, and a high power density substrate with 8×30mm rectangular diamond / copper embedded in oxygen-free copper is prepared by vacuum pressure infiltration technology, and the thermal load power is applied 600W / cm 2 , The junction temperature of the chip tested by a thermal imager is 63°C, which is 20-25°C lower than the junction temperature of the oxygen-free copper metal substrate.
Embodiment 3
[0028] combine figure 1 and figure 2 To illustrate this embodiment, first add molybdenum powder to position 1 of the near-net shape mold and then sinter it into porous molybdenum, fill diamond powder at position 2 of the near-net shape mold, and sinter again to obtain a composite porous preform inlaid with diamonds, using vacuum pressure The high power density substrate of 8×30mm rectangular diamond / copper embedded in molybdenum copper was prepared by impregnation technology, and the applied thermal load power was 400W / cm 2 , The junction temperature of the chip tested by a thermal imager is 64°C, which is 18-20°C lower than the junction temperature of the molybdenum-copper metal substrate.
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com