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Particle granularity measuring method based on two-dimensional Raman spectrum

A measurement method and particle technology, applied in the direction of measuring devices, Raman scattering, particle size analysis, etc., can solve the problems of non-real-time detection of particle sample damage detection, inability to realize real-time particle size measurement, time-consuming operation, etc.

Active Publication Date: 2016-06-22
TIANJIN ZHIQIAO DATA TECH CO LTD
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Problems solved by technology

The mechanical method is further divided into two types: the sieving method and the sedimentation method. Among them, the sieving method uses a sieve with a certain size of sieve to sieve the tested particle sample into several particle size levels by means of manual or mechanical vibration device, and obtains the particle size. Distribution is a particle size measurement method with simple equipment and wide application. However, it is time-consuming to operate and cannot realize real-time measurement of particle size; the sedimentation method is based on Lambert-Beer law and Stokes formula. The principle of different sedimentation velocities of particles in the force field is to obtain the particle size distribution of particles. scope
[0004] The wave characteristic method is divided into the direct imaging method, the optical holography method, the scattering method, etc. Among them, the direct imaging method mainly observes the measured particle samples directly through the optical microscope and the electron microscope. Although it has high measurement accuracy, the sampling rate The low and long measurement time limit its application range; the optical holography method mainly uses holographic technology to realize three-dimensional imaging of the measured particle samples, which can accurately record the particle size distribution and spatial distribution information of the measured particle samples, but , mainly used in the measurement of suspended particulate matter; the scattering method mainly realizes the measurement of particle size through the interaction between the laser and the measured particle sample, which is divided into static and dynamic two types. Static light scattering measures the spatial distribution of scattered light, and dynamic Light scattering studies the law of the intensity of scattered light at a fixed spatial position over time. At present, the scattering method is mainly based on Fraunhofer diffraction theory, Fresnel diffraction theory, Mie scattering theory and Rayleigh scattering theory, which can realize particle size The rapid measurement of , however, is limited by the particle size range

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  • Particle granularity measuring method based on two-dimensional Raman spectrum
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  • Particle granularity measuring method based on two-dimensional Raman spectrum

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[0017] In conjunction with the accompanying drawings, the detailed description is as follows. What is described here is mainly an implementation method of a particle size measurement method based on two-dimensional Raman spectroscopy.

[0018] figure 1 A flow chart of a particle size measurement method based on two-dimensional Raman spectroscopy provided by the present invention is shown, which is described in detail as follows.

[0019] The particulate matter to be measured is barium nitrate Ba(NO 3 ) 2 .

[0020] figure 2 Shown, Ba(NO 3 ) 2 Two-dimensional Raman spectroscopy of particulate matter, Ba(NO 3 ) 2 Particulate matter has two characteristic Raman peaks, namely, peak A and peak B, and peak B is larger than peak A. Therefore, peak B is intercepted for two-dimensional Gaussian fitting analysis to obtain peak B The two-dimensional Gaussian function expression for extracting the half-peak width W of the spectral peak B. On this basis, according to the linear ...

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Abstract

The invention relates to a particle granularity measuring method based on a two-dimensional Raman spectrum. The method includes the steps that all sets of particle matter with the known particle granularity are selected for a certain kind of particle matter, each set of particle matter has the same particle granularity, and the two-dimensional Raman spectrum of all the sets of particle matter with the known particle granularity is acquired; a feature Raman spectrum peak of each set of particle matter is truncated; a mathematical expression of the feature Raman spectrum peaks is acquired through a two-dimensional data fitting method; the half-peak widths W of the feature Raman spectrum peaks are extracted; the relational expression between the particle granularity P of the particle matter and the half-peak widths W is fit; the two-dimensional Raman spectrum of the particle matter with the to-be-measured particle granularity is acquired, the half-peak widths W of the spectrum are obtained according to the step of two-dimensional data fitting analysis, and then the particle granularity P is measured according to the relational expression between the particle granularity P of the particle matter and the half-peak widths W. The particle granularity of the matter can be simply, rapidly and losslessly measured.

Description

technical field [0001] The invention belongs to the technical field of particle size measurement, in particular to a particle size measurement method. Background technique [0002] Particles are a manifestation of material existence and constitute a rich and colorful material world. In modern industrial production, national defense construction and high-tech fields, granular materials, especially ultrafine powder materials, play an increasingly important role and are widely used in medicine, chemical industry, metallurgy, electronics, machinery, light industry, Food, construction and environmental protection and other fields. Since the properties of granular materials are mainly determined by the average particle size and particle size distribution parameters of the particles, it is necessary to accurately measure the particle size technology to achieve effective measurement of particle size and control the particle size accuracy of granular materials during production and ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/65G01N15/02
CPCG01N15/0205G01N21/65
Inventor 王慧捷李奇峰陈达
Owner TIANJIN ZHIQIAO DATA TECH CO LTD
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