Preparation method of FS-IGBT
A silicon chip and backside technology, which is applied in the field of power semiconductor devices, can solve the problems of difficulty, silicon chip warping, deformation, etc., and achieve the effect of small turn-off loss and reduced forward conduction voltage
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[0038] The principles and characteristics of the present invention will be further described below in conjunction with the accompanying drawings, and the examples given are only for explaining the present invention, and are not intended to limit the scope of the present invention.
[0039] Such as Figure 6 As shown, the present invention provides a kind of method that prepares FS-IGBT with thin drift region on thick silicon chip, comprises:
[0040] Step 1: Select two N-type monocrystalline silicon wafers as the first silicon wafer and the second silicon wafer. The thickness of the first silicon wafer is 300 microns, and lightly doped FZ silicon is used with a doping concentration of 2.5*10 14 piece / cm 3 , to form Figure 5 In the drift region 3 of the FS-IGBT mentioned in the above, the thickness of the second silicon wafer is 300 microns, and heavily doped CZ silicon is used, and the doping concentration is 5*10 19 piece / cm 3 , to form Figure 5 The back N+ region 11 o...
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