Femtosecond laser post-ionization mass spectrum apparatus
A femtosecond laser and ionized mass technology, applied in the field of mass spectrometry, which can solve problems such as quantitative analysis uncertainty
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Embodiment 1
[0036] Test of ionization efficiency after secondary neutral particle of pure copper target:
[0037]This example is intended to illustrate the gain in ionization efficiency that can be produced by using the femtosecond laser as a post-ionization means in the present invention. In this embodiment, a nanosecond laser is used to sputter onto a pure copper target as the primary ionization source. The nanosecond laser has a frequency of 1 kilohertz, a pulse width of 20 nanoseconds, and a power of 5 watts. The secondary particles generated by sputtering are focused on the surface of the target by the nanosecond laser, and then post-ionized by the femtosecond laser. The frequency of the femtosecond laser is 1 kHz, the pulse width is 35-45 femtoseconds, and the energy is 3.5 watts. It is focused on the secondary particle through a 35 cm lens. The neutral particles among the secondary particles are ionized by the femtosecond laser to greatly improve the ionization efficiency of the ...
Embodiment 2
[0039] Nickel-cadmium alloy post-ionization test:
[0040] This example is intended to illustrate that the post-ionization device can perform post-ionization component analysis on a multi-element mixed system. In this embodiment, a nanosecond laser is still used as the primary ionization source. A femtosecond laser acts as a post-ionization source. The experimental conditions used were consistent with Example 1. image 3 Shown is the secondary neutral particle mass spectrum of the nickel-cadmium alloy obtained in the embodiment test. It can be clearly seen from the figure that the device can accurately and clearly perform post-ionization analysis on the composition of the alloy.
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