Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Device and method for measuring granularity of dynamic light scattering nano particles of image

A technology of dynamic light scattering and measurement device, applied in nanometer and submicrometer fields, can solve the problems of complex instrument structure, low concentration of measured particles, difficult sample preparation, etc., and achieve the effect of reducing measurement time.

Inactive Publication Date: 2011-10-12
UNIV OF SHANGHAI FOR SCI & TECH
View PDF10 Cites 20 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This measurement method has a history of many years and is currently the most important method for measuring nanoparticles. However, there are still some shortcomings. For example, in order to obtain sufficient particle information, the sampling time is required to be very long, the instrument structure is complex, and the concentration of the measured particles is required to be extremely low. , resulting in difficulties in sample preparation, etc.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Device and method for measuring granularity of dynamic light scattering nano particles of image
  • Device and method for measuring granularity of dynamic light scattering nano particles of image
  • Device and method for measuring granularity of dynamic light scattering nano particles of image

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0044] Depend on figure 2 As shown, the laser beam emitted by the laser source 1 is incident on the sample cell 3, and the particle sample to be measured is placed in the sample cell 3, the particles will scatter the incident laser light, and the scattered light of the particles is collected by the lens 2 to form a space on the focal plane of the lens Distributed scattered light points, due to the different sizes of the particles and the effect of Brownian motion, the scattered light points of the spatial distribution will change randomly over time. Or CMOS camera shooting, reasonable control of the exposure time of the camera can get the movement trajectory of the scattered light point within the exposure time, instead of the light point. After obtaining the Brownian motion trajectory of the particle, the particle size can be obtained in time.

Embodiment 2

[0046] Depend on image 3 As shown, the difference from Example 1 is that the sample cell 3 is arranged behind the receiving lens 2, the laser beam emitted by the laser source 1 first passes through the lens 2 and then enters the sample cell 3, and the dynamic scattered light of the particles is then arranged in the A forward-facing area array digital camera 4, such as a CCD or a CMOS camera, acquires a track image of randomly distributed particle scattering light points.

Embodiment 3

[0048] Depend on Figure 4 As shown, in this embodiment, the area array digital camera 4 is not arranged in the forward direction of the incident laser beam 1, but is arranged at a 90-degree lateral angle position, and can also be arranged at a 45-degree lateral forward direction or a lateral rearward direction. 135 degree angle and other arbitrary lateral angles. It can be known from the Rayleigh scattering theory that the scattered light intensity in the side direction at the nanoparticle scale is 1 / 2 of the forward scattered light intensity. Therefore, the area array digital camera 4 can also measure the dynamic light scattering point track of the particle in the side direction. image.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a device and method for measuring granularity of dynamic light scattering nano particles of an image. The device comprises a laser source, a sample pool, a lens and a surface array photosensitive device which are coaxially arranged from left to right. The method comprises the steps: incident laser of a laser beam irradiates particles in the sample pool, the particles making a Brownian movement in the sample pool generate dynamic light scattering under the irradiation of the incident laser, dynamic light scattering signals of the particles are shot by a surface array digital camera configured on the focus surface of the lens after passing through the lens, and the exposure time of the camera is controlled so that scattering spots of the particles form a tracking line on a shot image, and granularity and distribution of the particles are obtained after data processing is carried out. The invention has the advantages that the scattering light dynamic signals of the particles are simultaneously measured by using the surface array digital camera and are processed to obtain the granularity and the distribution of the particles, the measurement time is short and the particles with a granularity range from nanometer to micrometer can be simultaneously measured.

Description

technical field [0001] The invention relates to a particle size measurement method based on the principle of dynamic light scattering, in particular to a method for measuring particle Brownian motion trajectory by using a single-frame single-exposure image of an area array digital camera to obtain nanometer and submicron particles. [0002] An image dynamic light scattering nanoparticle particle size measurement device and method for the particle size and distribution of micron particles. Background technique [0003] The most important method of particle measurement is the laser particle size analyzer based on light scattering theory, in which the static scattered light of particles is measured. The basic principle is that when the laser is incident on the particle to be measured, the particle will scatter the incident laser light, and the spatial distribution of the scattered light energy is related to the size of the particle. Measure the spatial distribution of the scatt...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N15/02B82Y35/00
Inventor 蔡小舒苏明旭
Owner UNIV OF SHANGHAI FOR SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com