Fabrication method of Ti movable device

A manufacturing method and device technology, applied in the manufacture of microstructure devices, processes for producing decorative surface effects, coatings, etc., can solve problems such as poor fracture toughness, complex processes, large aspect ratio, etc., and achieve self-stress Small, uniform etching, bright surface effect

Inactive Publication Date: 2009-06-03
PEKING UNIV
View PDF0 Cites 12 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

There is also the use of SCREAM (single crystalreactive etching and metalisation) technology to realize the movable structure, but this method is more complicated and difficult to achieve a larger aspect ratio
At the same time, as a structural material, silicon has its own shortcomings such as poor conductivity and poor fracture toughness. If there is contact and friction on the surface of the device, its reliability is not good.
At the same time, there is also a method of bonding first and then etching to realize the movable structure, but this will inevitably cause footing effect and lag effect, and because of the bonding sheet, the photolithography accuracy will deteriorate and the etching will be uniform Sex can also be affected
At present, there is no mature method for the processing of titanium movable structures, especially those with high aspect ratios.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Fabrication method of Ti movable device
  • Fabrication method of Ti movable device
  • Fabrication method of Ti movable device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0037] Example 1 Using SU8 as the middle layer for bonding

[0038] 1. Titanium Substrate Preparation and Mask Generation

[0039] Such as figure 1 As shown, the device material is titanium, and after annealing and chemical mechanical polishing, the surface of the titanium substrate is flat and bright. The mask is made of SU8 photoresist. SU8 is a kind of thick glue, different thickness can be obtained under different speed. The mask thickness is determined according to the required thickness of the device. In this embodiment, the device height is expected to be 40 microns, and it is recommended to use undiluted SU8-3010 at a rotation speed of 1000 to obtain a thickness of about 15 microns.

[0040] 2. Define the mask pattern

[0041] The pattern is defined by photolithography and development, and after pre-baking, exposure, development, and post-exposure baking (Post Exposure Bake), a mask pattern with flat and steep side walls can be obtained, such as figure 2 shown. ...

Embodiment 2

[0053] Example 2 Using BCB as the middle layer for bonding

[0054] Steps 1 to 6 are the same as in Example 1. When bonding in step 7, benzocyclobutene polymer (BCB, Benzocyclobutene) is used as the intermediate layer, and the pattern is defined before bonding. First coat the BCB on the bonded glass sheet, then use the photoresist as a mask to define the BCB pattern, and use the plasma dry etching method to etch and pattern the BCB, and then perform the same step 6 to obtain Patterned bonding of titanium substrates, such as Figure 10 shown. Subsequent steps are similar to those in Embodiment 1. In the final process of structure release, it is only necessary to remove the filled Parylene material with oxygen plasma.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a fabrication method of a Ti movable device. The fabrication method comprises the following steps: etching a Ti substrate by plasma etching technology to form a deep groove, and filling the deep groove; bonding the Ti substrate with another substrate; thinning the back of the Ti substrate by chemical corrosion and chemical mechanical polishing until the deep groove is exposed; removing the filler in the deep groove; and releasing the movable structure to obtain a Ti micro-device with the movable structure. The method can achieve high-accuracy and high-aspect-ratio 3D processing of Ti on a plurality kinds of substrates, and can be used for processing a plurality of MEMS devices. The entire process adopts micro-electronic processing method, and has the advantages of high accuracy and uniform etching. The fabricated device has the advantages of bright surface, smooth sidewall, flat surface and small stress.

Description

technical field [0001] The invention belongs to the technical field of microelectromechanical system (MEMS) processing, and in particular relates to a microfabrication method of a metal titanium movable device based on deep etching technology. Background technique [0002] At present, the movable structure with high aspect ratio in the mainstream silicon-based MEMS technology is widely used in various sensors and drivers. The obtained devices have high working efficiency, large capacitor plate area, large driving force, small occupied chip area, and high power carrying capacity. The degree of integration is high. The traditional silicon-based processing method is realized by using KOH back cavity etching combined with ICP deep etching, so the back cavity occupies a large area. Another common method is to use SOI sheet directly for processing. There is also the use of SCREAM (single crystalreactive etching and metalisation) technology to realize the movable structure, but t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): B81C1/00
Inventor 陈兢赵刚
Owner PEKING UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products