Method for preparing beta-FeSi2 semiconductor film by femtosecond pulsed laser
A femtosecond pulse and pulse laser deposition technology, which is applied in semiconductor/solid-state device manufacturing, vacuum evaporation plating, coating, etc. Photovoltaic characteristics, the effect of avoiding secondary pollution
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Embodiment 1
[0030] The substrate is made of Si(111) wafer or Si(100) wafer, and the pulse laser deposition thin film device is vacuumed, and the air pressure is 10 -3 Pa, put the target and the substrate in the pulsed laser deposition thin film device, the target and the substrate are parallel and 40mm apart, the substrate is heated to 500°C, and then kept warm, the temperature control accuracy is ±0.5°C, laser parameters: single pulse Laser energy 1.0mJ / pulse, wavelength 800nm, pulse width 50fs, repetition frequency 1000Hz, focusing lens f=1000mm, spot size 0.3mm, 1.1×10 14 W / cm 2 The laser beam with a peak power density irradiates the target, and the ejected plasma is deposited on the substrate, and a thin film is formed by epitaxial growth along the crystal plane of the substrate.
Embodiment 2
[0032] The substrate is made of quartz sheet or glass slide (glass), and the pulse laser deposition thin film device is vacuumed, and the air pressure is 10 -4 Pa, put the target and the substrate in the pulsed laser deposition thin film device, the target and the substrate are parallel and 50mm apart, the substrate is heated to 300°C, and then kept warm, the temperature control accuracy is ±0.5°C, laser parameters: single pulse Laser energy 1.5mJ / pulse, wavelength 800nm, pulse width 50fs, repetition frequency 1000Hz, focusing lens f=400mm, spot size 0.1mm, 1×10 15 W / cm 2 The laser beam with the peak power density irradiates the target. When the laser is irradiated, the target is rotated and the plasma flame is monitored in real time, and the position of the target is adjusted accordingly so that the focus of the laser spot does not deviate from the target. On-chip deposition, epitaxial growth along the substrate crystal plane to form a thin film.
Embodiment 3
[0034] After forming the thin film in Example 2 above, the substrate was heat-treated at 300° C. for 20 h in situ to further grow the grains of the thin film and eliminate internal stress.
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