Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for indirectly detecting lattice defects of MLCC dielectric ceramic

A technology for dielectric ceramics and lattice defects is applied in the field of indirect detection of lattice defects in MLCC dielectric ceramics.

Active Publication Date: 2021-10-26
广东微容电子科技有限公司
View PDF10 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In view of the above problems, this application provides a method for indirect detection of lattice defects in MLCC dielectric ceramics, aiming to solve the problem that the existing detection technology is complicated and not intuitive enough

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for indirectly detecting lattice defects of MLCC dielectric ceramic
  • Method for indirectly detecting lattice defects of MLCC dielectric ceramic

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] The following will clearly and completely describe the technical solutions in the embodiments of the present application with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of this application.

[0029] It should be noted that all directional indications in the embodiments of the present application, such as up, down, left, right, front, back... are only used to explain the relative positional relationship between the components in a certain posture as shown in the accompanying drawings, Sports conditions, etc., if the specific posture changes, the directional indication will also change accordingly.

[0030] In addition, the descriptions involvin...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to the field of dielectric ceramic lattice defect detection of ceramic elements and discloses a method for indirectly detecting dielectric ceramic lattice defects of an MLCC. The method comprises the following steps of preparing materials, preparing a test fixture, a high-temperature aging oven, an ampere meter, a universal meter and an insulation tester according to requirements; mounting the to-be-tested products, mounting the to-be-tested products on the test fixture in series; state confirmation, confirming that an installation state of the to-be-tested product is good; adjusting test conditions, putting a to-be-tested product into a high-temperature aging oven, and presetting a test temperature and a test voltage; setting value taking time, setting a current acquisition value taking time interval; starting a test, starting a high-temperature aging oven, and enabling the aging oven to be in a heat preservation state for testing after the temperature reaches a preset value; timing value taking, taking a value of the current of the to-be-tested object according to a preset time interval; and calculating an insulation resistance value at each moment. Through the mode, lattice defects of the MLCC dielectric ceramic can be effectively and indirectly detected, and operation is simple and visual.

Description

technical field [0001] The present application relates to the field of detection of lattice defects in ceramic element dielectrics, in particular to a method for indirect detection of lattice defects in MLCC dielectric ceramics. Background technique [0002] In metal oxides or other oxygen-containing compounds, oxygen atoms (oxygen ions) in the crystal lattice detach, resulting in a loss of oxygen, forming vacancies. Specifically in the field of ceramic components, dielectric ceramic lattice defects refer to the defects left by oxygen ions escaping from the dielectric ceramic lattice. Lattice defects in dielectric ceramics are the most common defects in dielectric ceramic materials of ceramic components, which have an important impact on the performance of dielectric ceramic materials. [0003] In recent years, in order to reduce production costs, MLCC (Multi-layer Ceramic Chip Capacitors) has used BME (Ni / Cu) base metal internal electrode technology to keep BME-MLCC in a n...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R27/02G01R31/00G01N27/04
CPCG01R27/025G01R31/003G01N27/041
Inventor 李茜
Owner 广东微容电子科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com