Single-photon avalanche diode with back irradiation, and manufacturing method thereof
A single-photon avalanche and backside illumination technology, applied in the field of single-photon detection, can solve the problems of high dark count rate and low detection efficiency of single-photon avalanche diodes, and achieve the effects of suppressing tunneling effect, optimizing structure, and reducing electric field
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[0035] In order to better understand the content of the patent of the present invention, the technical solution of the present invention will be further described below in conjunction with the accompanying drawings.
[0036] Such as figure 1 As shown, the back-illuminated single photon avalanche diode includes a P-type epitaxial layer 1, a P+ heavily doped region 2 is arranged inside the P-type epitaxial layer 1, and a P-lowly doped region is coaxially arranged on the periphery of the P+ heavily doped region 2 3. A P-type avalanche doped region 4 is arranged coaxially below the P-lowly doped region 3, an N+ heavily doped region 5 is arranged on both sides of the P+ heavily doped region 2, and a coaxially arranged below the N+ heavily doped region 5 N well region 6, N-type avalanche doped region 7 is arranged at intervals below the P-type avalanche doped region 4, and N− low doped region 8 is arranged below the N-type avalanche doped region 7.
[0037] The P+ heavily doped reg...
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