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A technology for chip inspection and equipment, applied in measurement devices, optical testing flaws/defects, cleaning methods and utensils, etc., can solve problems such as reducing inspection accuracy, chip quality impact, and impact on inspection results, avoiding position shift, improving Reliability, the effect of improving stability
Inactive Publication Date: 2020-12-25
深圳市琦美创科技有限公司
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[0003] When the existing chip testing equipment detects, if the main body is too humid, it will affect the quality of the chip. Not only that, when the existing chip testing equipment detects, the chip is easily covered with dust and causes It will affect the detection results and reduce the detection accuracy, thereby reducing the reliability of the existing chip detection equipment
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[0025] The present invention is described in further detail now in conjunction with accompanying drawing. These drawings are all simplified schematic diagrams, which only illustrate the basic structure of the present invention in a schematic manner, so they only show the configurations related to the present invention.
[0026] Such as figure 1 As shown, a dust removal type chip detection device includes a main body 1, a worktable 3 and a camera 2, the camera 2 is fixed on the top of the main body 1, the workbench 3 is fixed on the bottom of the main body 1, and the work The table 3 and the camera 2 are arranged facing each other, a notch is provided on the top of the work table 3, and a PLC is provided inside the main body 1, which is characterized in that it also includes two dust removal mechanisms and two dehumidification mechanisms, and two dehumidification mechanisms The mechanisms are respectively arranged on the inner walls of both sides of the main body 1, the dehumi...
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Abstract
The invention relates to dust removal type chip detection equipment. The dust removal type chip detection equipment comprises a main body, a workbench and a camera, and further comprises two dust removal mechanisms and two dehumidification mechanisms, wherein each dehumidification mechanism comprises an air suction assembly, a drying box, a drying net and a connecting pipe, each dust removal mechanism comprises a connecting box, a connecting pipe, a nozzle and a fixing assembly, and each fixing assembly comprises an air cylinder, a piston, a branch pipe, a driving plate, a sealing plate, a spring, a support rod, a sliding block, two hinge rods, and two driving rods. According to the dust removal type chip detection equipment, the dehumidification function is achieved through the dehumidification mechanisms, the situation that the quality of the chip is influenced due to the fact that the humidity inside the main body is too high is avoided, the dust removal function on the chip is achieved through the dust removal mechanisms, and the situation that dust covers the chip to influence the detection result is avoided, so that the reliability of the equipment is improved.
Description
technical field [0001] The invention relates to the field of chips, in particular to a dust-removing type chip testing device. Background technique [0002] Chip is a general term for semiconductor component products. The process of chip testing is to test the electrical characteristics of the packaged chip in various environments, such as power consumption, operating speed, withstand voltage, etc. After testing, the chip is tested according to its electrical characteristics. The characteristics are divided into different grades. Products that pass the general test are labeled with specifications, models, and date of manufacture, and then packaged before leaving the factory. Chips that fail the test are designated as downgraded products or Waste chips, so testing equipment is one of the essential equipment in chip manufacturing. [0003] When the existing chip testing equipment detects, if the main body is too humid, it will affect the quality of the chip. Not only that, wh...
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